Search Results - "Buchwalter, L.P."

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  1. 1

    3-D Silicon Integration and Silicon Packaging Technology Using Silicon Through-Vias by Knickerbocker, J.U., Patel, C.S., Andry, P.S., Tsang, C.K., Buchwalter, L.P., Sprogis, E.J., Hua Gan, Horton, R.R., Polastre, R.J., Wright, S.L., Cotte, J.M.

    Published in IEEE journal of solid-state circuits (01-08-2006)
    “…System-on-Chip (SOC) and System-on-Package (SOP) technologies each have advantages depending on application needs. As system architects and designers leverage…”
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    Journal Article Conference Proceeding
  2. 2

    Tantalum, tantalum nitride, and chromium adhesion to polyimide: effect of annealing ambient on adhesion by Buchwalter, L.P., Holloway, K.

    Published in Journal of adhesion science and technology (01-01-1998)
    “…The adhesion of Ta, TaN (cubic), TaN x (mixture of cubic and amorphous phases), and Cr to 3,3',4,4'-biphenylene tetracarboxylic acid…”
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    Journal Article
  3. 3

    Characterization of micro-bump C4 interconnects for Si-carrier SOP applications by Wright, S.L., Polastre, R., Gan, H., Buchwalter, L.P., Horton, R., Andry, P.S., Sprogis, E., Patel, C., Tsang, C., Knickerbocker, J., Lloyd, J.R., Sharma, A., Sri-Jayantha, M.S.

    “…This paper describes yield, contact resistance, and preliminary reliability test results on micro-bump C4 interconnects in modules containing Si-chips and…”
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    Conference Proceeding
  4. 4

    Reaction of polyaniline with NMP at elevated temperatures by Afzali, A., Buchwalter, S.L., Buchwalter, L.P., Hougham, G.

    Published in Polymer (Guilford) (01-08-1997)
    “…Heating a dilute solution of polyaniline emeraldine base in 1-methyl-2 pyrrolidinone under nitrogen at elevated temperatures resulted in the reduction of PANI…”
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    Journal Article
  5. 5

    A CMOS-compatible process for fabricating electrical through-vias in silicon by Andry, P.S., Tsang, C., Sprogis, E., Patel, C., Wright, S.L., Webb, B.C., Buchwalter, L.P., Manzer, D., Horton, R., Polastre, R., Knickerbocker, J.

    “…In the past, traditional CMOS scaling has been one of the principal levers to achieve increased system-level performance. Today, scaling is becoming…”
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    Conference Proceeding
  6. 6

    Poly(methyl methacrylate) degradation during x‐ray photoelectron spectroscopy analysis by Buchwalter, L. P., Czornyj, G.

    “…Poly(methyl methacrylate) (PMMA) was chosen as a model lithographic material to study the effect of A1 K α radiation and the thermal (flood gun) electron flux…”
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    Journal Article
  7. 7

    System-on-package (SOP) technology, characterization and applications by Knickerbocker, J.U., Andry, P.S., Buchwalter, L.P., Colgan, E.G., Cotte, J., Gan, H., Horton, R.R., Sri-Jayantha, S.M., Magerlein, J.H., Manzer, D., McVicker, G., Patel, C.S., Polastre, R.J., Sprogis, E.S., Tsang, C.K., Webb, B.C., Wright, S.L.

    “…A silicon-based system-on-package (SOP) is described. Novel capabilities of SOP are expected to enable lower cost, more efficient and higher performance…”
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    Conference Proceeding
  8. 8
  9. 9

    Pb-free microjoints (50 /spl mu/m pitch) for the next generation microsystems: the fabrication, assembly and characterization by Gan, H., Wright, S.L., Polastre, R., Buchwalter, L.P., Horton, R., Andry, P.S., Patel, C., Tsang, C., Knickerbocker, J., Sprogis, E., Pavlova, A., Kang, S.K., Lee, K.W.

    “…To support the next generation highly integrated microsystem with 3D silicon integration using fine pitch interconnection and Si carrier, we develop a…”
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    Conference Proceeding
  10. 10