Search Results - "Bublik, Vladimir T."

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  1. 1

    Regularities of Structure Formation in 30 mm Rods of Thermoelectric Material during Hot Extrusion by Lavrentev, Mikhail G., Bublik, Vladimir T., Milovich, Filipp O., Panchenko, Viktoriya P., Parkhomenko, Yuri N., Prostomolotov, Anatoly I., Tabachkova, Nataliya Yu, Verezub, Nataliya A., Voronov, Mikhail V., Yarkov, Ivan Yu

    Published in Materials (21-11-2021)
    “…In this study, Ingots of (Bi, Sb)2Te3 thermoelectric material with p-type conductivity have been obtained by hot extrusion. The main regularities of hot…”
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    Journal Article
  2. 2

    Capabilities of X-ray diffuse scattering method for study of microdefects in semiconductor crystals by Bublik, Vladimir T., Voronova, Marina I., Shcherbachev, Kirill D.

    Published in Modern electronic materials (01-12-2018)
    “…The capabilities of X-ray diffuse scattering (XRDS) method for the study of microdefects in semiconductor crystals have been overviewed. Analysis of the…”
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    Journal Article
  3. 3

    Regularities of microdefect formation in silicon during heat treatment for internal getter synthesis by Bublik, Vladimir T., Voronova, Marina I., Shcherbachev, Kirill D., Mezhennyi, Mikhail V., Reznik, Vladimir Ya

    Published in Modern electronic materials (05-04-2020)
    “…Gettering is defined as a process by which metal impurities in the device region are reduced by localizing them in predetermined, passive regions of the…”
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    Journal Article
  4. 4

    Structure formation by hot extrusion of thermoelectric bismuth chalcogenide solid solution rods by Bublik, Vladimir T., Lavrentev, Mikhail G., Osvenskii, Vladimir B., Parkhomenko, Yuri N., Tabachkova, Nataliya Yu

    Published in Modern electronic materials (31-12-2019)
    “…Major advantage of extruded Bi 2 Te 3 based thermoelectric materials is high mechanical strength compared with that of melt-crystallized materials. Mechanical…”
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    Journal Article
  5. 5

    Effect of proton doping and heat treatment on the structure of single crystal silicon by Asadchikov, Victor E., Dyachkova, Irina G., Zolotov, Denis A., Krivonosov, Yuri S., Bublik, Vladimir T., Shikhov, Alexander I.

    Published in Modern electronic materials (01-03-2019)
    “…The quality and structural perfection of single crystal silicon have been studied using double-crystal X-ray diffraction after hydrogen ion implantation and…”
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    Journal Article
  6. 6
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  8. 8

    Structure, phase composition and mechanical properties of ZrO2 partially stabilized with Y2O3 by Mikhail A. Borik, Vladimir T. Bublik, Mariya Yu. Vilkova, Alexey V. Kulebyakin, Elena E. Lomonova, Philipp O. Milovich, Valentina A. Myzina, Polina A. Ryabockina, Nataliya Yu. Tabachkova, Sergey N. Ushakov

    Published in Modern electronic materials (01-03-2015)
    “…The structure of PSZ crystals has been studied as a function of the content of the stabilizing impurity (Y2O3) by X-ray diffraction, transmission electron…”
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    Journal Article
  9. 9

    The Results of Thermal Expansion Investigation for Effective Thermoelectric Materials by Shtern, Yury I., Rogachev, Maxim S., Bublik, Vladimir T., Tarasova, Irina V., Pozdniakov, Andrei V.

    “…The thermal expansion of effective thermoelectric materials in the temperature range of 200-1200 K has been studied using quartz dilatometers. In present work…”
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    Conference Proceeding