Search Results - "Bub, Sergej"

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  1. 1

    Automotive High-Speed Interfaces: Future Challenges for System-level HV-ESD Protection and First- Time-Right Design by Bub, Sergej, Mergens, Markus, Hardock, Andreas, Holland, Steffen, Hilbrink, Ayk

    “…This paper describes future design challenges of discrete system-level ESD protection (high-voltage, low-capacitance) of automotive high-speed data links such…”
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    Conference Proceeding
  2. 2

    Transient Response of ESD Protection Devices for a High-Speed I/O Interface by Zhou, Jianchi, Xu, Yang, Bub, Sergej, Holland, Steffen, Meiguni, Javad Soleiman, Pommerenke, David, Beetner, Daryl G.

    “…System-efficient electrostatic discharge (ESD) design (SEED) models of a diode and transient voltage suppressor (TVS) were developed to study their transient…”
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    Journal Article
  3. 3

    Characterization and Modeling of Commercial ICs for System-Efficient ESD Design by Peng, Zhekun, Xu, Yang, Yea, Manje, Bub, Sergej, Holland, Steffen, Kim, DongHyun, Pommerenke, David, Beetner, Daryl G.

    “…Optimizing electrostatic discharge (ESD) protection strategies requires simulation models of both on - and off -die ESD devices, but detailed information about…”
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    Journal Article
  4. 4

    Improved SEED Modeling of an ESD Discharge to a USB Cable by Xu, Yang, Zhou, Jianchi, Bub, Sergej, Holland, Steffen, Meiguni, Javad Soleiman, Pommerenke, David, Beetner, Daryl G.

    “…Integrated circuits (ICs) connected to a universal serial bus (USB) interface require robust electrostatic discharge (ESD) protection strategies due to the…”
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    Journal Article
  5. 5

    A Physics-Based Model for Snapback-Type ESD Protection Devices by Yan, Xin, Mousavi, Seyed Mostafa, Shen, Li, Xu, Yang, Zhang, Wei, Bub, Sergej, Holland, Steffen, Beetner, Daryl G.

    “…A simplified physical-based model for deep-snapback transient voltage suppressors (TVS) is developed in this article. While based on physics, the number of…”
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    Journal Article
  6. 6

    Transient Analysis of ESD Protection Circuits for High-Speed ICs by Meiguni, Javad, Zhou, Jianchi, Maghlakelidze, Giorgi, Xu, Yang, Hoseini Izadi, Omid, Marathe, Shubhankar, Shen, Li, Bub, Sergej, Holland, Steffen, Beetner, Daryl, Pommerenke, David

    “…Electrostatic discharge (ESD) failures in high-speed integrated circuits (ICs) cause critical reliability problems in electronic devices. Transient voltage…”
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    Journal Article
  7. 7

    Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse by Zhou, Jianchi, Wei, Pengyu, Shen, Li, Yan, Xin, Maghlakelidze, Giorgi, Notermans, Guido, Bub, Sergej, Holland, Steffen, Pommerenke, David

    “…An electrostatic discharge (ESD) generator may create pre- and postpulses in addition to the main pulse. These artifacts can cause additional device under test…”
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    Journal Article
  8. 8

    Application of TVS Models for SEED Simulation of a Variety of TVS Devices by Shen, Li, Xu, Yang, Holland, Steffen, Bub, Sergej, Pommerenke, David, Beetner, Daryl

    “…Accurate models of transient voltage suppression (TVS) devices are important for determining the suitability of electrostatic discharge (ESD) protection…”
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    Conference Proceeding
  9. 9

    Modeling an ESD Gun Discharge to a USB Cable by Xu, Yang, Zhou, Jianchi, Beetner, Daryl, Meiguni, Javad, Pommerenke, David, Bub, Sergej, Holland, Steffen

    “…When an electrostatic discharge (ESD) gun discharges to a USB cable, the routing and quality of the cable impacts the waveform seen at the printed circuit…”
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    Conference Proceeding
  10. 10

    A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices by Yan, Xin, Mousavi, Seyed Mostafa, Shen, Li, Xu, Yang, Zhang, Wei, Bub, Sergej, Holland, Steffen, Pommerenke, David, Beetner, Daryl G.

    “…A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient…”
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    Conference Proceeding
  11. 11

    SEED Modeling of an ESD Gun Discharge to a USB Cable Surrogate by Xu, Yang, Zhou, Jianchi, Meiguni, Javad, Beetner, Daryl G., Bub, Sergej, Holland, Steffen, Pommerenke, David

    “…An IC protected by a transient voltage suppression (TVS) diode may fail if the TVS device does not turn on or does not turn on quickly enough, causing the IC…”
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    Conference Proceeding
  12. 12

    Race Conditions Among Protection Devices for a High Speed I/O Interface by Zhou, Jianchi, Meiguni, Javad, Bub, Sergej, Holland, Steffen, Notermans, Guido, Xu, Yang, Maghlakelidze, Giorgi, Pommerenke, David, Beetner, Daryl

    “…The ESD coupling path and on-board impedances strongly affect the ESD rise time seen on a PCB trace. Possible race conditions between external and on-die ESD…”
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    Conference Proceeding