Search Results - "Brunhaver, J."

How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs by Libano, F., Rech, P., Neuman, B., Leavitt, J., Wirthlin, M., Brunhaver, J.

“…Convolutional neural networks (CNNs) are becoming attractive alternatives to traditional image-processing algorithms in self-driving vehicles for automotive,…”
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Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAs by Libano, F., Wilson, B., Wirthlin, M., Rech, P., Brunhaver, J.

“…Convolutional neural networks are quickly becoming viable solutions for self-driving vehicles, military, and aerospace applications. At the same time, due to…”
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Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Core Digital Structures by Wallace, T., Spear, M., Privat, A., Neuendank, J., Irumva, G., Wilson, D., Esqueda, I. Sanchez, Barnaby, H. J., Turowski, M., Mikkola, E., Hughart, D., Marinella, M. J., Brunhaver, J., Gutierrez, Amos, Von Niederhausern, R., Holloway, S., Beltran, D., Taggart, J. L.

“…An apparent layout dependence for total ionizing dose (TID) susceptibility in a commercial 12-nm fin-based field-effect transistor (FinFET) technology is…”
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Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies by Privat, A., Barnaby, H. J., Spear, M., Esposito, M., Manuel, J. E., Clark, L., Brunhaver, J., Duvnjak, A., Jokai, R., Holbert, K. E., McLain, M. L., Marinella, M. J., King, M. P.

“…Total ionizing dose response of 14-nm bulk-Si FinFETs has been studied with a specially designed test chip. The radiation testing shows evidence of interface…”
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Enabling Software-Defined RF Convergence with a Novel Coarse-Scale Heterogeneous Processor by Bliss, D. W., Ajayi, T., Akoglu, A., Aliyev, I., Basaklar, T., Belayneh, L., Blaauw, D., Brunhaver, J., Chakrabarti, C., Chang, L., Chen, K.-Y., Chen, M.-H., Chen, X., Chiriyath, A. R., Daftardar, A., Dreslinski, R., Dutta, A., Farcas, A. J., Fu, Y., Goksoy, A., He, X., Hassan, Md. S., Herschfelt, A., Holtom, J., Kim, H.-S., Krishnakumar, A. N., Li, Y., Ma, O., Mack, J., Mallik, S., Mandal, S. K., Marculescu, R., McCall, B., Mudge, T., Ogras, U. Y., Pandey, V., Siddiqui, S., Sun, Y.-H., Venkataramani, A., Wei, X., Willis, B. R., Yu, H., Yue, Y.

“…RF system development is traditionally constrained by a restrictive trade-off between power efficiency and programmatic flexibility. We outline a path towards…”
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On the Reliability of Xilinx's Deep Processing Unit and Systolic Arrays for Matrix Multiplication by Libano, F., Rech, P., Brunhaver, J.

“…Through neutron beam experiments, we measure the radiation sensitivity of Xilinx's DPU, and discuss the trade-offs between performance, area, and reliability…”
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FPU Generator for Design Space Exploration by Galal, S., Shacham, O., Brunhaver, J. S., Jing Pu, Vassiliev, A., Horowitz, M.

“…FPUs have been a topic of research for almost a century, leading to thousands of papers and books. Each advance focuses on the virtues of some specific new…”
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Avoiding game over: bringing design to the next level by Shacham, Ofer, Wachs, Megan, Danowitz, Andrew, Galal, Sameh, Brunhaver, John, Qadeer, Wajahat, Sankaranarayanan, Sabarish, Vassiliev, Artem, Richardson, Stephen, Horowitz, Mark

“…Technology scaling has created a catch-22: technology now can do almost anything we want, but the NRE design costs are so high, that almost no one can afford…”
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