Search Results - "Brundle, C. R."

A New Mechanism For XPS Line Broadening: The 2p-XPS of Ti(IV) by Bagus, Paul S, Nelin, Connie J, Brundle, C. R, Chambers, Scott A

“…There is almost a factor of 2 increase in the full width at half maximum (FWHM) of the main Ti 2p1/2 XPS peak compared to the 2p3/2 in the closed-shell Ti­(IV)…”
Get full text

A rigorous non-empirical theoretical analysis of the 2p XPS of NiO: Is it necessary to invoke nonlocal screening? by Bagus, Paul S., Brundle, C.R., Ilton, Eugene S.

“…The role of ligand field effects and many-body effects arising from angular momentum coupling and shake effects for the XPS of NiO, as a representative…”
Get full text

Comments on the Theory of Complex XPS Spectra: Extracting Chemical Information from the Fe 3p XPS of Fe Oxides by Bagus, Paul S., Nelin, Connie J., Brundle, C. R., Crist, B. Vincent, Lahiri, N., Rosso, Kevin M.

“…XPS analyses of open shell ionic compounds, especially oxides of the first row transition metals, for information such as oxidation state tend to focus on…”
Get full text

XPS and angle resolved XPS, in the semiconductor industry: Characterization and metrology control of ultra-thin films by Brundle, C.R., Conti, Giuseppina, Mack, Paul

“…This review discusses the development of X-ray photoelectron spectroscopy, XPS, used as a characterization and metrology method for ultra-thin films in the…”
Get full text

Some surface and interface characterization and metrology requirements in the wafer processing industry by Brundle, C. R.

“…With the rapid decrease in thickness of deposited layers during silicon wafer processing, there has been a parallel increase in the use of surface/interface…”
Get full text

Report on the 47th IUVSTA Workshop 'Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films' by Herrera-Gomez, A., Grant, J. T., Cumpson, P. J., Jenko, M., Aguirre-Tostado, F. S., Brundle, C. R., Conard, T., Conti, G., Fadley, C. S., Fulghum, J., Kobayashi, K., Kövér, L., Nohira, H., Opila, R. L., Oswald, S., Paynter, R. W., Wallace, R. M., Werner, W. S. M., Wolstenholme, J.

“…A summary of the workshop entitled ‘Angle‐Resolved XPS: The Current Status and Future Prospects for Angle‐resolved XPS of Nano and Subnano Films’ is given,…”
Get full text

Detection and Characterization of Dimethylethanolamine-based Corrosion Inhibitors at Steel Surfaces. I. The Use of XPS and ToF-SIMS by Brundle, C. R., Grunze, M., Mäder, U., Blank, N.

“…Formulations based on dilute aqueous solutions ofN,N′‐dimethylethanolamine (DMEA) are used to protect reinforcement steel bars (‘rebar’) in concrete from…”
Get full text

Chemical significance of x-ray photoelectron spectroscopy binding energy shifts: A Perspective by Bagus, Paul S., Nelin, Connie J., Brundle, C. R.

“…The principal intent of this Perspective is to review the mechanisms that are responsible for the shifts of binding energies, ΔBE, observed in x-ray…”
Get full text

Spin-dependent electron attenuation by transmission through thin ferromagnetic films by PAPPAS, D. P, KAÊMPER, K.-P, MILLER, B. P, HOPSTER, H, FOWLER, D. E, BRUNDLE, C. R, LUNTZ, A. C, SHEN, Z.-X

Get full text

Bonding and electronic structure in high-Tc superconducting oxides : a case for the importance of the cations by BARR, T. L, BRUNDLE, C. R

Get full text

Shake loss intensities in x-ray photoelectron spectroscopy: Theory, experiment, and atomic composition accuracy for MgO and related compounds by Bagus, Paul S., Brundle, C. R., Vincent Crist, B.

“…The relative intensities of XPS core levels, scaled by their photoionization cross sections, are regularly used to determine sample atomic composition. Cross…”
Get full text

Self-restoring of the active surface in the hydrogen sponge LaNi5 by Siegmann, H C, Schlapbach, L, BRUNDLE, C R

“…Photoemission studies combined with measurements of the magnetic susceptibility show that La segregates to the surface of LaNi5 in the presence of O2 or H2O,…”
Get full text

Evidence for Crystal-Face Specificity in Surface Segregation of CuNi Alloys by Wandelt, K., Brundle, C. R.

“…Experimental evidence is presented for crystal-face specificity in surface segregation at CuNi alloy surfaces using angular X-ray photoemission spectroscopy,…”
Get full text

Perfluoro effect in photoelectron spectroscopy. I. Nonaromatic molecules by Brundle, C. R, Robin, M. B, Kuebler, N. A, Basch, Harold

Get full text

Many-body effects for the Mg 2s XPS of MgO by Bagus, Paul S., Nelin, Connie J., Brundle, C. R., Vincent Crist, B.

“…The energy separation of the higher lying cation XPS binding energies, BEs, for MgO is examined. It is shown that the Hartree–Fock BEs overestimate the…”
Get full text

Perfluoro effect in photoelectron spectroscopy. II. Aromatic molecules by Brundle, C. R, Robin, M. B, Kuebler, N. A

Get full text

Why the close‐packed Ni(111) surface dissociatively chemisorbs oxygen and nucleates oxide faster than the more open Ni(100) surface by Brundle, C. R.

“…The 300 K kinetics of dissociative chemisorption and oxide island nucleation and growth are compared for Ni(100) and Ni(111). We conclude that the behavior of…”
Get full text

Evidence of oxygen-island formation on Al(111) : cluster-model theory and x-ray photoelectron spectroscopy by BAGUS, P. S, BRUNDLE, C. R, ILLAS, F, PARMIGIANI, F, POLZONETTI, G

“…The O 1s X-ray photoelectron spectroscopy spectrum for Al(111)/O at 300K shows two components whose behavior as a function of time and variation of detection…”
Get full text

Characterization of film materials in wafer processing technology development by XPS by Saheli, Ghazal, Liu, Wei, Lazik, Christopher, Uritsky, Yuri, Bevan, Malcolm, Tang, Wei, Ma, Paul, Venkatasubramanian, Eswaranand, Bobek, Sarah, Kulshreshtha, Prashant, Brundle, C.R.

“…A brief introduction reviews the changes that have occurred in semiconductor wafer processing, which, coupled with developments in X ray Photoelectron…”
Get full text

Compositional variations in doped iron oxide magnetic thin films by Hermsmeier, B., Brundle, C. R., Baglin, J. E. E.

“…Iron oxide films are candidates for high‐density thin‐film disk storage media. The films are usually prepared by postdeposition oxidation to produce γ‐Fe2O3…”
Get full text