Search Results - "Bravman, J. C."

High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction by Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., Spolenak, R., Brown, W. L., Marieb, T., Fujimoto, H., Batterman, B. W., Patel, J. R.

“…The availability of high brilliance synchrotron sources, coupled with recent progress in achromatic focusing optics and large area two-dimensional detector…”
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Subcritical debonding of polymer/silica interfaces under monotonic and cyclic loading by Snodgrass, J.M., Pantelidis, D., Jenkins, M.L., Bravman, J.C., Dauskardt, R.H.

“…The effects of interface chemistry and alternating mechanical loads on subcritical debonding of thin polymer layers from inorganic dielectrics are of…”
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Thermal strain and stress in copper thin films by Vinci, R.P., Zielinski, E.M., Bravman, J.C.

“…Desired improvements in the performance and reliability of integrated circuit interconnects may necessitate a move from aluminum alloys to copper. Before…”
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Local plasticity of Al thin films as revealed by x-ray microdiffraction by Spolenak, R, Brown, W L, Tamura, N, MacDowell, A A, Celestre, R S, Padmore, H A, Valek, B, Bravman, J C, Marieb, T, Fujimoto, H, Batterman, B W, Patel, J R

“…Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large…”
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Quantitative characterization of electromigration-induced plastic deformation in Al(0.5wt%Cu) interconnect by Barabash, R.I, Ice, G.E, Tamura, N, Valek, B.C, Bravman, J.C, Spolenak, R, Patel, J.R

“…Electromigration-induced failure in metal interconnect constitutes a major reliability problem in the semiconductor industry. Recently, experimental techniques…”
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Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films by Weihs, T. P., Hong, S., Bravman, J. C., Nix, W. D.

“…The mechanical deflection of cantilever microbeams is presented as a new technique for testing the mechanical properties of thin films. Single-layer microbeams…”
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Important factors for silane adhesion promoter efficacy: surface coverage, functionality and chain length by Jenkins, M. L., Dauskardt, R. H., Bravman, J. C.

“…The effects of an ammonia-based catalyst, surface coverage, organofunctional group and chain length on silane adhesion promoter efficacy were examined at a…”
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The influence of strain energy on abnormal grain growth in copper thin films by Zielinski, E. M., Vinci, R. P., Bravman, J. C.

“…Biaxial stress and strain in (100) and (111) oriented grains have been measured as a function of annealing temperature for a Cu film on an oxidized Si…”
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Formation of titanium silicide on narrow gates using laser thermal processing by Verma, G., Gelatos, C., Talwar, S., Bravman, J.C.

“…One of the crucial issues that must be faced when using titanium silicide in advanced IC structures is the difficulty encountered in transforming the silicide…”
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Differential thermal budget in laser processing: application to formation of titanium silicide by Verma, G., Talwar, S., Bravman, J.C.

“…One of the crucial issues that must be faced when using titanium silicide in advanced IC structures is the difficulty encountered in phase transforming the…”
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Effects of barrier layer and processing conditions on thin film Cu microstructure by ZIELINSKI, E. M, VINCI, R. P, BRAVMAN, J. C

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Electromigration-induced plastic deformation in passivated metal lines by Valek, B. C., Bravman, J. C., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Spolenak, R., Brown, W. L., Batterman, B. W., Patel, J. R.

“…We have used scanning white beam x-ray microdiffraction to study microstructural evolution during an in situ electromigration experiment on a passivated Al(Cu)…”
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Submicron X-ray diffraction by MacDowell, A.A., Celestre, R.S., Tamura, N., Spolenak, R., Valek, B., Brown, W.L., Bravman, J.C., Padmore, H.A., Batterman, B.W., Patel, J.R.

“…At the Advanced Light Source in Berkeley we have instrumented a beam line that is devoted exclusively to X-ray micro-diffraction problems. By micro-diffraction…”
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Separation of film thickness and grain boundary strengthening effects in Al thin films on Si by Venkatraman, Ramnath, Bravman, John C.

“…We have measured stress variations with temperature as a function of film thickness and a given grain size in pure Al and Al–0.5% Cu films on Si substrates…”
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Thickness dependence of the twin density in YBa2Cu3O7-δ thin films sputtered onto MgO substrates by STREIFFER, S. K, ZIELINSKI, E. M, LAIRSON, B. M, BRAVMAN, J. C

“…The lengths and spacings of twins in YBa2Cu3O7−δ thin films deposited onto MgO substrates have been measured by transmission electron microscopy as a function…”
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Stress relaxation in free-standing aluminum beams by Lee, Hoo-Jeong, Zhang, Ping, Bravman, John C.

“…The stress-relaxation behavior of 2-μm-thick free-standing thin-film aluminum beams was evaluated by using a piezoelectric-actuated mechanical tester, which…”
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Microwave properties of highly oriented YBa2Cu3O7-x thin films by INAM, A, WU, X. D, MOFFAT, D, RUBIN, D, SHU, Q. S, KALOKITIS, D, FATHY, A, PENDRICK, V, BROWN, R, BRYXKI, B, BELOHOUBEK, E, DRABECK, L, NAZAR, L, HEGDE, M. S, ROGERS, C. T, VENKATESAN, T, SIMON, R. W, DALY, K, PADAMSEE, H, KIRCHGESSNER, J

“…We have performed intra- and extra-cavity microwave frequency (1–100 GHz) measurements on high quality Y1Ba2Cu3O7−x superconducting thin films on (100) LaAlO3…”
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Physics, technology, and modeling of polysilicon emitter contacts for VLSI bipolar transistors by Patton, G.L., Bravman, J.C., Plummer, J.D.

“…The physics of minority-carrier injection into polysilicon-contacted emitters has been studied through a series of experiments correlating the base current of…”
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Molecular beam epitaxy of layered Dy-Ba-Cu-O compounds by SCHLOM, D. G, ECKSTEIN, J. N, TURNER, F, HELLMAN, E. S, STREIFFER, S. K, HARRIS, J. S. JR, BEASLEY, M. R, BRAVMAN, J. C, GEBALLE, T. H, WEBB, C, VON DESSONNECK, K. E

“…Heteroepitaxial Dy-Ba-Cu-O films have been grown in situ on SrTiO3 substrates using an oxygen plasma beam and elemental source beams in a modified molecular…”
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Growth of YBa2Cu3O7-δ on vicinally polished MgO substrates by STREIFFER, S. K, LAIRSON, B. M, BRAVMAN, J. C

“…YBaCu3O7−δ thin films were grown on vicinally polished MgO [001] substrates. The orientation of the films is strongly influenced by the substrate surface…”
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