Search Results - "Bozovich, Amanda N."

Single-Event Transients in a Commercially Available, Integrated Germanium Photodiode for Silicon Photonic Systems by Tzintzarov, George N., Teng, Jeffrey W., Bozovich, Amanda N., Allen, Gregory R., Nergui, Delgermaa, Mensah, Yaw A., Cressler, John D.

“…Ion-induced SETs were captured from a germanium photodiode (PD) in an integrated silicon photonics technology platform. Statistics from 400 ion-strike events…”
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Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission by Zajac, Stephanie A., Bozovich, Amanda N., Rax, Bernard G., Davila, Joe, Nguyen, Duc, Parker, Wilson P., Kenna, Aaron J., McClure, Steven S., Thomas, Jason L., Stanford, Kelly W., Sundgaard, Mitch J.

“…We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion…”
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Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators by Bozovich, Amanda N., Irom, Farokh

“…This data compendium reports single event transient (SET) and total ionizing dose (TID) test results for commonly used commercial-off-the-shelf (COTS) and…”
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SEE Sensitivity Changes in ISSI DDR2 Memories by Guertin, Steven M., Bozovich, Amanda N.

“…SEE evaluation of a new revision of ISSI DDR2 devices shows a significant increase in low LET SEFI behavior while SBU sensitivity increases somewhat…”
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Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response by Bozovich, Amanda N., Nguyen, Duc, Rax, Bernard G., Davila, Joe, Zajac, Stephanie A.

“…This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID)…”
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Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission by Bozovich, Amanda N., Rax, Bernard G., Davila, Joe, Nguyen, Duc, Kenna, Aaron J., Zajac, Stephanie A., McClure, Steven S., Thomas, Jason L., Scheick, Leif Z., Stanford, Kelly W., Gevargiz, Patrick, Sundgaard, Mitch J.

“…This paper reports recent total ionizing dose (TID) test results post 300 kRad(Si) for a variety of common part types evaluated for use on NASA/JPL's Europa…”
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