Search Results - "Bouet, Nathalie"
-
1
11 nm hard X-ray focus from a large-aperture multilayer Laue lens
Published in Scientific reports (20-12-2013)“…The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with…”
Get full text
Journal Article -
2
Efficiency of a multilayer-Laue-lens with a 102 μ m aperture
Published in Applied physics letters (24-08-2015)“…A multilayer-Laue-lens (MLL) comprised of WSi2/Al layers stacked to a full thickness of 102 μm was characterized for its diffraction efficiency and dynamical…”
Get full text
Journal Article -
3
Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens
Published in Optics express (18-05-2015)“…We report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering…”
Get full text
Journal Article -
4
Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy
Published in Micromachines (Basel) (15-10-2020)“…We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The…”
Get full text
Journal Article -
5
Study on an effective one-dimensional ion-beam figuring method
Published in Optics express (27-05-2019)“…Ion-beam figuring (IBF) is a precise surface finishing technique used for the production of ultra-precision optical surfaces. In this study, we propose an…”
Get full text
Journal Article -
6
-
7
Universal dwell time optimization for deterministic optics fabrication
Published in Optics express (08-11-2021)“…Computer-Controlled Optical Surfacing (CCOS) has been greatly developed and widely used for precision optical fabrication in the past three decades. It relies…”
Get full text
Journal Article -
8
Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges
Published in Optics express (16-10-2017)“…We discuss misalignment-induced aberrations in a pair of crossed multilayer Laue lenses used for achieving a nanometer-scale x-ray point focus. We thoroughly…”
Get full text
Journal Article -
9
RISE: robust iterative surface extension for sub-nanometer X-ray mirror fabrication
Published in Optics express (10-05-2021)“…Precision optics have been widely required in many advanced technological applications. X-ray mirrors, as an example, serve as the key optical components at…”
Get full text
Journal Article -
10
E-PVT: enhanced position-velocity-time scheduler for computer-controlled optical finishing with comprehensive considerations of dynamics constraints, continuity and efficiency
Published in Optics express (22-04-2024)“…Deterministic computer-controlled optical finishing is an essential approach for achieving high-quality optical surfaces. Its determinism and convergence rely…”
Get full text
Journal Article -
11
Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses
Published in Optics express (17-04-2017)“…We report scanning hard x-ray imaging with a monolithic focusing optic consisting of two multilayer Laue lenses (MLLs) bonded together. With optics…”
Get full text
Journal Article -
12
2D MEMS-based multilayer Laue lens nanofocusing optics for high-resolution hard x-ray microscopy
Published in Optics express (08-06-2020)“…We report on the development of 2D integrated multilayer Laue lens (MLL) nanofocusing optics used for high-resolution x-ray microscopy. A…”
Get full text
Journal Article -
13
Machine-learning-based automatic small-angle measurement between planar surfaces in interferometer images: A 2D multilayer Laue lenses case
Published in Optics and lasers in engineering (01-02-2023)“…•A machine-learning-based method is developed to automatically measure the small angle between multiple planar surfaces in an interferometer image.•This…”
Get full text
Journal Article -
14
Ion Beam Figuring System for Synchrotron X-Ray Mirrors Achieving Sub-0.2-µrad and Sub-0.5-nm Root Mean Square
Published in Nanomanufacturing and metrology (01-12-2023)“…Optics with high-precision height and slope are increasingly desired in numerous industrial fields. For instance, Kirkpatrick–Baez (KB) mirrors play an…”
Get full text
Journal Article -
15
Machine-learning-based automatic small-angle measurement between planar surfaces in interferometer images: A 2D multilayer Laue lenses case
Published in Optics and lasers in engineering (22-10-2022)“…Here, we report a new machine-learning-based approach to automatically measure the small angle between multiple planar surfaces characterized by white light…”
Get full text
Journal Article -
16
Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution
Published in Scientific reports (05-02-2016)“…We developed a scanning hard x-ray microscope using a new class of x-ray nano-focusing optic called a multilayer Laue lens and imaged a chromosome with…”
Get full text
Journal Article -
17
New figuring model based on surface slope profile for grazing-incidence reflective optics
Published in Journal of synchrotron radiation (01-09-2016)“…Surface slope profile is widely used in the metrology of grazing‐incidence reflective optics instead of surface height profile. Nevertheless, the theoretical…”
Get full text
Journal Article -
18
Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements
Published in Journal of synchrotron radiation (01-11-2016)“…A new system of slits called `spiderweb slits' have been developed for depth‐resolved powder or polycrystalline X‐ray diffraction measurements. The slits act…”
Get full text
Journal Article -
19
One-dimensional ion-beam figuring for grazing-incidence reflective optics
Published in Journal of synchrotron radiation (01-01-2016)“…One‐dimensional ion‐beam figuring (1D‐IBF) can improve grazing‐incidence reflective optics, such as Kirkpatrick–Baez mirrors. 1D‐IBF requires only one motion…”
Get full text
Journal Article -
20
Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips
Published in Nanomaterials (Basel, Switzerland) (08-11-2024)“…The resolution of a mega-electron-volt scanning transmission electron microscope (MeV-STEM) is primarily governed by the properties of the incident electron…”
Get full text
Journal Article