New manufacturing technology for InP epitaxial layers and properties of Schottky diodes made on their basis
A new technological approach to production of structurally perfect epitaxial films LPE-grown on "soft" porous n/sup +/-InP substrates is considered. We studied surface morphology, boundary between phases in TiB/sub x/-n-InP contact and I-V curves of Au-TiB/sub x/-n-InP Schottky diodes made...
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Published in: | 2004 14th International Crimean Conference "Microwave and Telecommunication Technology" (IEEE Cat. No.04EX843) pp. 528 - 529 |
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Main Authors: | , , , , , , , , , , |
Format: | Conference Proceeding |
Language: | English |
Published: |
IEEE
2004
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Subjects: | |
Online Access: | Get full text |
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Summary: | A new technological approach to production of structurally perfect epitaxial films LPE-grown on "soft" porous n/sup +/-InP substrates is considered. We studied surface morphology, boundary between phases in TiB/sub x/-n-InP contact and I-V curves of Au-TiB/sub x/-n-InP Schottky diodes made on "soft" and "rigid" (standard) n/sup +/-InP substrates. The advantages of epitaxial layers grown on porous n/sup +/-InP substrates and barrier structures on their basis are demonstrated. |
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ISBN: | 9667968693 9789667968694 |
DOI: | 10.1109/CRMICO.2004.183319 |