Search Results - "Blanca, C. M."
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Laser-diode-stimulated emission depletion microscopy
Published in Applied physics letters (05-05-2003)“…We report subdiffraction resolution in far-field fluorescence microscopy through laser-diode-stimulated emission depletion of molecular markers. The…”
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Single sharp spot in fluorescence microscopy of two opposing lenses
Published in Applied physics letters (08-10-2001)“…We demonstrate theoretically, experimentally, and in an imaging application the possibility to generate a single predominant sharp diffraction maximum in the…”
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Near-IR Spectral Imaging of Semiconductor Absorption Sites in Integrated Circuits
Published in Science Diliman (01-12-2004)“…We derive spectral maps of absorption sites in integrated circuits (ICs) by varying the wavelength of the optical probe within the near-IR range. This method…”
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Axial superresolution with ultrahigh aperture lenses
Published in Optics express (26-08-2002)“…We explore the current limits of the axial resolution of optical sectioning microscopy using a single lens, by combining the resolving power of novel 1.45…”
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Spectral microthermography for component discrimination and hot spot identification in integrated circuits
Published in Optics express (06-02-2006)“…We demonstrate an efficient and versatile spectral microthermography technique for identifying hot and cold spots in the active layer of a biased integrated…”
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High-resolution differential thermography of integrated circuits with optical feedback laser scanning microscopy
Published in Applied physics letters (05-12-2005)“…We demonstrate a noninvasive technique for generating differential thermal maps of semiconductor edifices in integrated circuits (IC) at diffraction-limited…”
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7
Monte Carlo Model of Light Scattering in Polymer Dispersed Liquid Crystals: Polarization Effects and Defects
Published in Molecular crystals and liquid crystals (Philadelphia, Pa. : 2003) (01-01-2004)“…A numerical model based on the Monte Carlo protocol is developed to describe the evolution of polarized light as it propagates through a polymer dispersed…”
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Determination of the unknown phase difference in 4Pi-confocal microscopy through the image intensity
Published in Optics communications (01-06-2002)“…We investigate the effect of the phase difference of the interfering wavefronts on the image intensity in 4Pi-confocal microscopy and thereby introduce a…”
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