Search Results - "Blaise, Philippe"

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    Ab initio calculation of effective work functions for a TiN/HfO2/SiO2/Si transistor stack by Prodhomme, Pierre-Yves, Fontaine-Vive, Fabien, Geest, Abram Van Der, Blaise, Philippe, Even, Jacky

    Published in Applied physics letters (11-07-2011)
    “…Ab initio techniques are used to calculate the effective work function (Weff) of a TiN/HfO2/SiO2/Si stack representing a metal-oxide-semiconductor (MOS)…”
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    Journal Article
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    La guerre des voies de communication au Cameroun, 1914-1916 by Essomba, Philippe-Blaise

    “…Le souci de s’imposer dans les colonies allemandes pendant la Première Guerre mondiale conduit Français et Anglais à exploiter au maximum les voies de…”
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    Journal Article
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    HfO2-Based RRAM: Electrode Effects, Ti/HfO2 Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations by Traore, Boubacar, Blaise, Philippe, Vianello, Elisa, Perniola, Luca, De Salvo, Barbara, Nishi, Yoshio

    Published in IEEE transactions on electron devices (01-01-2016)
    “…We investigate in detail the effects of metal electrodes on the switching performance and conductive filament (CF) stability of HfO 2 -based RRAM. The current-…”
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    Journal Article
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    Exploring charge hopping transport in amorphous HfO$_2$: An approach combing $ab\ initio$ methods and model Hamiltonian by Hirchaou, Youssef, Sklenard, Benoit, Goes, Wolfgang, Blaise, Philippe, Triozon, François, Li, Jing

    Published in Applied physics letters (2024)
    “…Charge hopping transport is typically modeled by Marcus theory with the coupling strengths and activation energies extracted from the constrained density…”
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    Journal Article
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    Exploring charge hopping transport in amorphous HfO2: An approach combing ab initio methods and model Hamiltonian by Hirchaou, Youssef, Sklénard, Benoît, Goes, Wolfgang, Blaise, Philippe, Triozon, François, Li, Jing

    Published in Applied physics letters (29-01-2024)
    “…Charge hopping transport is typically modeled by Marcus theory with the coupling strengths and activation energies extracted from the constrained density…”
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    Journal Article
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    On the Origin of Low-Resistance State Retention Failure in HfO2-Based RRAM and Impact of Doping/Alloying by Traore, Boubacar, Blaise, Philippe, Vianello, Elisa, Grampeix, Helen, Jeannot, Simon, Perniola, Luca, De Salvo, Barbara, Nishi, Yoshio

    Published in IEEE transactions on electron devices (01-12-2015)
    “…We study in detail the impact of alloying HfO 2 with Al (Hf 1_x Al 2 xO 2+x ) on the oxide-based resistive random access memory (RRAM) (OxRRAM) thermal…”
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    Journal Article
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    HfO2/Ti Interface Mediated Conductive Filament Formation in RRAM: An Ab Initio Study by Traore, Boubacar, Blaise, Philippe, Sklenard, Benoit, Vianello, Elisa, Magyari-Kope, Blanka, Nishi, Yoshio

    Published in IEEE transactions on electron devices (01-02-2018)
    “…We address the role of the Ti/HfO 2 interface on the conductive filament (CF) formation within the context of oxide-based resistive random access memories…”
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    Journal Article
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    Reduction of Monoclinic HfO2: A Cascading Migration of Oxygen and Its Interplay with a High Electric Field by Traoré, Boubacar, Blaise, Philippe, Sklénard, Benoît

    Published in Journal of physical chemistry. C (03-11-2016)
    “…Using density functional theory, we investigated the formation of an extended Frenkel pair (EFP) in monoclinic m-HfO2 which we propose to be a prototype defect…”
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    Journal Article
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    Prediction of semimetallic tetragonal Hf2O3 and Zr2O3 from first principles by Xue, Kan-Hao, Blaise, Philippe, Fonseca, Leonardo R C, Nishi, Yoshio

    Published in Physical review letters (08-02-2013)
    “…Tetragonal semimetallic phases are predicted for Hf(2)O(3) and Zr(2)O(3) using density functional theory. The structures belong to space group P4[over ¯]m2 and…”
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    Journal Article
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    Gasification of charcoal derived from tropical wood residues in an updraft fixed bed reactor by Diboma, Benjamin Salomon, Atiotsia, Victor Hugo, Che, Louis Colins, Essomba, Philippe Blaise, Bot, Bill Vaneck, Tamba, Jean Gaston

    Published in Bioresource technology reports (01-02-2023)
    “…This paper aims to produce hydrogen-rich synthesis gas from the charcoal of three tropical tree species. The approach involves sequentially the production and…”
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    Journal Article
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    HfO 2 /Ti Interface Mediated Conductive Filament Formation in RRAM: An Ab Initio Study by Traore, Boubacar, Blaise, Philippe, Sklenard, Benoit, Vianello, Elisa, Magyari-Kope, Blanka, Nishi, Yoshio

    Published in IEEE transactions on electron devices (01-02-2018)
    “…We address the role of the Ti/HfO$_2$ interface on the conductive filament (CF) formation within the context of oxide-based resistive random access memories…”
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    Journal Article
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    A Combined Ab Initio and Experimental Study on the Nature of Conductive Filaments in Pt/HfO2/Pt Resistive Random Access Memory by Xue, Kan-Hao, Traoré, Boubacar, Blaise, Philippe, Fonseca, Leonardo, Vianello, Elisa, Molas, Gabriel, de Salvo, Barbara, Ghibaudo, Gérard, Magyari-Kope, Blanka, Nishi, Yoshio

    Published in IEEE transactions on electron devices (01-05-2014)
    “…Through ab initio calculations, we propose that the conductive filaments in Pt/HfO 2 /Pt resistive random access memories are due to HfO x suboxides, possibly…”
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    Journal Article
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    Investigation of Forming, SET, and Data Retention of Conductive-Bridge Random-Access Memory for Stack Optimization by Guy, Jeremy, Molas, Gabriel, Blaise, Philippe, Bernard, Mathieu, Roule, Anne, Le Carval, Gilles, Delaye, Vincent, Toffoli, Alain, Ghibaudo, Gerard, Clermidy, Fabien, De Salvo, Barbara, Perniola, Luca

    Published in IEEE transactions on electron devices (01-11-2015)
    “…In this paper, we investigate in depth Forming, SET, and Retention of conductive-bridge random-access memory (CBRAM). A kinetic Monte Carlo model of the CBRAM…”
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    Journal Article
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    A Link Between CBRAM Performances and Material Microscopic Properties Based on Electrical Characterization and Atomistic Simulations by Nail, Cecile, Molas, Gabriel, Blaise, Philippe, Sklenard, Benoit, Berthier, Remy, Bernard, Mathieu, Perniola, Luca, Ghibaudo, Gerard, Vallee, Christophe

    Published in IEEE transactions on electron devices (01-11-2017)
    “…In this paper, we investigate the link between various resistive memory (RRAM) electrical characteristics: endurance, window margin (WM), and retention. For…”
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    Journal Article
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    Hybrid‐RRAM toward Next Generation of Nonvolatile Memory: Coupling of Oxygen Vacancies and Metal Ions by Sassine, Gilbert, Nail, Cécile, Blaise, Philippe, Sklenard, Benoit, Bernard, Mathieu, Gassilloud, Rémy, Marty, Aurélie, Veillerot, Marc, Vallée, Christophe, Nowak, Etienne, Molas, Gabriel

    Published in Advanced electronic materials (01-02-2019)
    “…Here, the impact of copper and oxygen vacancy balance in filament composition as a key factor for oxide‐based conductive bridge random access memories (hybrid…”
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    Journal Article
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    HfO sub(2)-Based RRAM: Electrode Effects, Ti/HfO sub(2) Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations by Traore, Boubacar, Blaise, Philippe, Vianello, Elisa, Perniola, Luca, De Salvo, Barbara, Nishi, Yoshio

    Published in IEEE transactions on electron devices (01-01-2016)
    “…We investigate in detail the effects of metal electrodes on the switching performance and conductive filament (CF) stability of HfO sub(2)-based RRAM. The…”
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    Journal Article
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    Nanoscale FET: How To Make Atomistic Simulation Versatile, Predictive, and Fast at 5nm Node and Below by Blaise, Philippe, Kapoor, Udita, Townsend, Mark, Guichard, Eric, Charles, James, Lemus, Daniel, Kubis, Tillmann

    “…Ultra-scaled FET technology requires simulations at the atomic scale. We present the Victory Atomistic tool inherited from Nemo5. Thanks to a combination of…”
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    Conference Proceeding