Search Results - "Bizau, J.M."

Redetermination of absolute partial photoionization cross sections of He and Ne atoms between 20 and 300 eV photon energy by Bizau, J.M., Wuilleumier, F.J.

“…Using photoelectron spectroscopy, we have measured some relative partial photoionization cross sections in He and Ne atoms. By compiling these results, along…”
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A merged-beam setup at SOLEIL dedicated to photoelectron–photoion coincidence studies on ionic species by Bizau, J.M., Cubaynes, D., Guilbaud, S., El Eassan, N., Al Shorman, M.M., Bouisset, E., Guigand, J., Moustier, O., Marié, A., Nadal, E., Robert, E., Nicolas, C., Miron, C.

“…•Description of a merged-beam setup at SOLEIL synchrotron radiation facility.•Unique setup of this kind allowing photoelectron spectroscopy on ionic…”
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Recent results on the photoionisation of multiply-charged ions by Bizau, J.M., Bouisset, E., Blancard, C., Champeaux, J.P., Compant la Fontaine, A., Couillaud, C., Cubaynes, D., Hitz, D., Vinsot, C., Wuilleumier, F.J.

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A study of the interaction of VUV light with soot nanoparticles by LeGarrec, J.L., Mitchell, J.B.A., Travers, D., Bizau, J.M.

“…The interaction of VUV radiation with soot nanoparticles has been studied in an experiment at the LURE synchrotron radiation source. It was found that…”
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A dedicated electron spectrometer for photoionization studies of atomic ions with synchrotron radiation by Rouvellou, B., Bizau, J.M., Cubaynes, D., Journel, L., Al Moussalami, S., Wuilleumier, F.J.

“…A cylindrical mirror analyzer (CMA) dedicated to the photoionization on atomic ions of experiments, has been designed using a new semi-analytical method. A…”
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First observation of photoelectron spectra emitted in the photoionization of a single charged-ion beam with synchrotron radiation by Bizau, J.M., Cubaynes, D., Richter, M., Wuilleumier, F.J., Obert, J., Putaux, J.C., Morgan, T.J., Kaellne, E., Sorensen, S., Damany, A.

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Final-State Symmetry for the n = 2 States in Photoionized Helium Determined by Theory and Experiment by Bizau, J. M., Wuilleumier, F., Dhez, P., Ederer, D. L., Chang, T. N., Krummacher, S., Schmidt, V.

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