Search Results - "Biswas, Dhrubes"
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Probing InGaN immiscibility at AlGaN/InGaN heterointerface on silicon (111) through two-step capacitance-voltage and conductance-voltage profiles
Published in Materials & design (05-11-2017)“…Immiscibility of InGaN hinders epitaxial growth of high-quality AlGaN/InGaN heterojunction, which could have superior performances than AlGaN/GaN in view of…”
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Journal Article -
2
Health care social media: expectations of users in a developing country
Published in Medicine 2.0 (01-07-2013)“…Affordability, acceptability, accommodation, availability, and accessibility are the five most important dimensions of access to health services. Seventy two…”
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Journal Article Conference Proceeding -
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Enhancement of two dimensional electron gas concentrations due to Si3N4 passivation on Al0.3Ga0.7N/GaN heterostructure: strain and interface capacitance analysis
Published in AIP advances (01-04-2015)“…Enhancement of two dimensional electron gas (2DEG) concentrations at Al0.3Ga0.7N/GaN hetero interface after a-Si3N4 (SiN) passivation has been investigated…”
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Journal Article -
4
Investigation of cross-hatch surface and study of anisotropic relaxation and dislocation on InGaAs on GaAs (001)
Published in Electronic materials letters (01-05-2016)“…There exist discrepancies between reports on cross-hatch (CH) behaviour and its interaction with interfacial misfit dislocations in the literature. In this…”
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Journal Article -
5
Effects of threading dislocations on drain current dispersion and slow transients in unpassivated AlGaN/GaN/Si heterostructure field-effect transistors
Published in Applied physics letters (18-08-2014)“…Current transient analysis combined with response to pulsed bias drives have been used to explore the possibilities of threading dislocations affecting the…”
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Journal Article -
6
Comprehensive strain and band gap analysis of PA-MBE grown AlGaN/GaN heterostructures on sapphire with ultra thin buffer
Published in AIP advances (01-11-2014)“…In this work, cluster tool (CT) Plasma Assisted Molecular Beam Epitaxy (PA-MBE) grown AlGaN/GaN heterostructure on c-plane (0 0 0 1) sapphire (Al2O3) were…”
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Journal Article -
7
Comparative DC Characteristic Analysis of AlGaN/GaN HEMTs Grown on Si(111) and Sapphire Substrates by MBE
Published in Journal of electronic materials (01-04-2014)“…A comparative assessment of AlGaN/GaN high-electron-mobility transistors (HEMTs) grown by molecular beam epitaxy on silicon and sapphire substrates has been…”
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Journal Article -
8
Quantum well engineering of InAlAs/InGaAs HEMTs for low impact ionization applications
Published in Current applied physics (01-05-2013)“…The performance of InAlAs/InGaAs quantum well field effect transistors are subject to high impact ionization and band-to-band tunneling (BTBT) due to its…”
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Journal Article -
9
An Alternative X-ray Diffraction Analysis for Comprehensive Determination of Structural Properties in Compositionally Graded Strained AlGaN Epilayers
Published in Electronic materials letters (01-11-2018)“…In this letter, a standard deviation based optimization technique has been applied on High Resolution X-ray Diffraction symmetric and asymmetric scan results…”
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Journal Article -
10
Impact of varying buffer thickness generated strain and threading dislocations on the formation of plasma assisted MBE grown ultra-thin AlGaN/GaN heterostructure on silicon
Published in AIP advances (01-05-2015)“…Plasma-assisted molecular beam epitaxy (PAMBE) growth of ultra-thin Al0.2Ga0.8N/GaN heterostructures on Si(111) substrate with three buffer thickness (600…”
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Journal Article -
11
Effective surface treatment for GaN metal-insulator-semiconductor high-electron-mobility transistors using HF plus N2 plasma prior to SiN passivation
Published in Japanese Journal of Applied Physics (27-11-2015)“…An effective surface cleaning technique is demonstrated for the GaN metal-insulator-semiconductor high-electron-mobility transistor (MIS-HEMT) passivation…”
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Journal Article -
12
Evolution and analysis of nitride surface and interfaces by statistical techniques: A correlation with RHEED through kinetic roughening
Published in Electronic materials letters (01-07-2015)“…In-situ RHEED and ex-situ AFM characterizations have been employed to investigate transformations of surface topography with the thickness of PAMBE grown AlGaN…”
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Journal Article -
13
Reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure
Published in Electronic materials letters (01-03-2016)“…The reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure is investigated by current-voltage measurement in temperature range from 298 K to…”
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Journal Article -
14
Graded barrier AlGaN/AlN/GaN heterostructure for improved 2-dimensional electron gas carrier concentration and mobility
Published in Electronic materials letters (01-11-2014)“…This paper presents an approach of compositional grading of the barrier in AlGaN/GaN quantum well heterostructure to achieve high two dimensional electron gas…”
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Journal Article -
15
Reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure
Published in Electronic materials letters (01-03-2016)Get full text
Journal Article -
16
Effect of trapped charge in AlGaN/GaN and AlGaN/InGaN/GaN heterostructure by temperature dependent threshold voltage analysis
Published in Superlattices and microstructures (01-01-2018)“…The effect of trap energy states in AlGaN/InGaN/GaN heterostructure is investigated by temperature dependent threshold voltage measurement from 298 K to 373 K…”
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Journal Article -
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Tilt investigation of In(Al,Ga)As metamorphic buffer layers on GaAs (001) substrate: A novel technique for tilt determination
Published in Crystal research and technology (1979) (01-12-2016)“…Crystallographic tilt and Surface topography of InGaAs and InAlAs based metamorphic buffer structures on GaAs (001) substrate grown by molecular beam epitaxy…”
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Journal Article -
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Highly Sensitive Acetone Sensor Based on Pd/AlGaN/GaN Resistive Device Grown by Plasma-Assisted Molecular Beam Epitaxy
Published in IEEE transactions on electron devices (01-11-2017)“…Highly sensitive acetone sensing performance of Pd/AlGaN/GaN resistive devices in the temperature range of 100 °C-250 °C and in the detection range of 100-1000…”
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Journal Article -
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Comparison of different grading schemes in InGaAs metamorphic buffers on GaAs substrate: Tilt dependence on cross-hatch irregularities
Published in Applied surface science (01-12-2015)“…•InGaAs graded MBs with different grading scheme has been grown by MBE on GaAs.•Continuously graded MB exhibits smoother surface morphology.•Grading scheme has…”
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Journal Article -
20
Comparative analysis of parameter extraction techniques for AlGaN/GaN HEMT on silicon/sapphire substrate
Published in Microelectronics and reliability (01-11-2017)“…We report a comparative study of artificial neural network (ANN) model and small signal model (SSM) based on extracted parameters. ANN model training is done…”
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