Search Results - "Bings, J.P."

Plastic packaging and burn-in effects on ionizing dose response in CMOS microcircuits by Clark, S.D., Bings, J.P., Maber, M.C., Williams, M.K., Alexander, D.R., Pease, R.L.

“…Results are reported from an investigation of the effects of packaging and burn-in on the post-irradiation performance of National Semiconductor 54AC02 Quad…”
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Total dose results for the AD9225RH analog-to-digital converter by Bings, J.P., Gadlage, M.J., Clark, S.D., Sheehy, J., Morgan, D., Steinbach, R., Carney, C., Kelley, D., Kaakani, H., Elliot, C.

“…This paper presents total dose test results for the AD9225RH. The AD9225RH is a radiation hardened 12-bit, 25-MSPS ADC manufactured by Honeywell Inc., based in…”
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Radiation effects in analog CMOS analog-to-digital converters by Turflinger, T.L., Davey, M.V., Bings, J.P.

“…Analog CMOS circuitry is becoming common in the marketplace. Two commercial ADC are tested in the total dose and dose rate environments. Test results and…”
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Current single event effects and radiation damage results for candidate spacecraft electronics by O'Bryan, M.V., LaBel, K.A., Ladbury, R.L., Poivey, C., Howard, J.W., Reed, R.A., Kniffin, S.D., Buchner, S.P., Bings, J.P., Titus, J.L., Clark, S.D., Turflinger, T.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Jones, M.R., Sanders, A.B., Irwin, T.L., Cox, S.R., Kahric, Z.A., Palor, C.D., Sciarini, J.A.

“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced…”
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