Search Results - "Bings, J."
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1
Plastic packaging and burn-in effects on ionizing dose response in CMOS microcircuits
Published in IEEE transactions on nuclear science (01-12-1995)“…Results are reported from an investigation of the effects of packaging and burn-in on the post-irradiation performance of National Semiconductor 54AC02 Quad…”
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Journal Article -
2
Total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA
Published in 2003 IEEE Radiation Effects Data Workshop (2003)“…We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include…”
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Conference Proceeding -
3
Total dose results for the AD9225RH analog-to-digital converter
Published in 2003 IEEE Radiation Effects Data Workshop (2003)“…This paper presents total dose test results for the AD9225RH. The AD9225RH is a radiation hardened 12-bit, 25-MSPS ADC manufactured by Honeywell Inc., based in…”
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Conference Proceeding -
4
Current single event effects and radiation damage results for candidate spacecraft electronics
Published in IEEE Radiation Effects Data Workshop (2002)“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced…”
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Conference Proceeding -
5
Radiation effects in analog CMOS analog-to-digital converters
Published in 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference (1996)“…Analog CMOS circuitry is becoming common in the marketplace. Two commercial ADC are tested in the total dose and dose rate environments. Test results and…”
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Conference Proceeding