Search Results - "Billinger, R.L."
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Precision measurement method for cryogenic amplifier noise temperatures below 5 K
Published in IEEE transactions on microwave theory and techniques (01-03-2006)“…We report precision measurements of the effective input noise temperature of a cryogenic (liquid-helium temperature) monolithic-microwave integrated-circuit…”
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Journal Article -
2
Errors resulting from the reflectivity of calibration targets
Published in IEEE transactions on geoscience and remote sensing (01-01-2005)“…For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it…”
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Journal Article -
3
Comparison of adapter characterization methods
Published in IEEE transactions on microwave theory and techniques (01-12-1999)“…We review and compare three different methods for characterization of precision adapters. Two of the methods are one-port techniques using two different…”
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Journal Article -
4
On-wafer measurements of noise temperature
Published in IEEE transactions on instrumentation and measurement (01-12-1999)“…The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on a wafer. This…”
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Journal Article -
5
Comparison of methods for adapter characterization
Published in 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282) (1999)“…We review and compare three methods for characterization of precision adapters using a vector network analyzer. Two of the methods are one-port techniques, and…”
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Conference Proceeding Journal Article -
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Errors due to the reflectivity of calibration targets
Published in IGARSS 2004. 2004 IEEE International Geoscience and Remote Sensing Symposium (2004)“…For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it…”
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Conference Proceeding -
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NFRAD - Review of the New Nist Noise Measurement System
Published in 55th ARFTG Conference Digest (01-06-2000)“…The National Institute of Standards and Technology (NIST) has completed design and testing of a new noise measurement system. The new system is capable of…”
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Conference Proceeding