Search Results - "Billinger, R.L."

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  1. 1

    Precision measurement method for cryogenic amplifier noise temperatures below 5 K by Randa, J., Gerecht, E., Dazhen Gu, Billinger, R.L.

    “…We report precision measurements of the effective input noise temperature of a cryogenic (liquid-helium temperature) monolithic-microwave integrated-circuit…”
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    Journal Article
  2. 2

    Errors resulting from the reflectivity of calibration targets by Randa, J., Walker, D.K., Cox, A.E., Billinger, R.L.

    “…For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it…”
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    Journal Article
  3. 3

    Comparison of adapter characterization methods by Randa, J., Wiatr, W., Billinger, R.L.

    “…We review and compare three different methods for characterization of precision adapters. Two of the methods are one-port techniques using two different…”
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    Journal Article
  4. 4

    On-wafer measurements of noise temperature by Randa, J., Billinger, R.L., Rice, J.L.

    “…The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on a wafer. This…”
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    Journal Article
  5. 5

    Comparison of methods for adapter characterization by Randa, J., Wiatr, W., Billinger, R.L.

    “…We review and compare three methods for characterization of precision adapters using a vector network analyzer. Two of the methods are one-port techniques, and…”
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    Conference Proceeding Journal Article
  6. 6

    Errors due to the reflectivity of calibration targets by Randa, J., Walker, D.K., Cox, A.E., Billinger, R.L.

    “…For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it…”
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    Conference Proceeding
  7. 7

    NFRAD - Review of the New Nist Noise Measurement System by Grosvenor, C.A., Randa, J., Billinger, R.L.

    Published in 55th ARFTG Conference Digest (01-06-2000)
    “…The National Institute of Standards and Technology (NIST) has completed design and testing of a new noise measurement system. The new system is capable of…”
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    Conference Proceeding