Search Results - "Bera, L."

Refine Results
  1. 1

    High-performance fully depleted silicon nanowire (diameter /spl les/ 5 nm) gate-all-around CMOS devices by Singh, N., Agarwal, A., Bera, L.K., Liow, T.Y., Yang, R., Rustagi, S.C., Tung, C.H., Kumar, R., Lo, G.Q., Balasubramanian, N., Kwong, D.-L.

    Published in IEEE electron device letters (01-05-2006)
    “…This paper demonstrates gate-all-around (GAA) n- and p-FETs on a silicon-on-insulator with /spl les/ 5-nm-diameter laterally formed Si nanowire channel…”
    Get full text
    Journal Article
  2. 2

    AlGaN/GaN two-dimensional-electron gas heterostructures on 200 mm diameter Si(111) by Tripathy, S., Lin, Vivian K. X., Dolmanan, S. B., Tan, Joyce P. Y., Kajen, R. S., Bera, L. K., Teo, S. L., Kumar, M. Krishna, Arulkumaran, S., Ng, G. I., Vicknesh, S., Todd, Shane, Wang, W. Z., Lo, G. Q., Li, H., Lee, D., Han, S.

    Published in Applied physics letters (20-08-2012)
    “…This Letter reports on the epitaxial growth, characterization, and device characteristics of crack-free AlGaN/GaN heterostructures on a 200 mm diameter Si(111)…”
    Get full text
    Journal Article
  3. 3

    Electrochemical Characterization of Bronze Exposed to Outdoor Atmosphere by Otmačić Ćurković, Helena, Mikić, Dajana, Bera, Luka, Kovačević, Ema, Marcelja, Marijana

    “…The aim of this work was to examine corrosion behaviour of bare and artificial patinated bronzes during exposure to urban outdoor atmosphere. Studies were…”
    Get full text
    Journal Article Paper
  4. 4

    Vertically Stacked SiGe Nanowire Array Channel CMOS Transistors by Fang, W.W., Singh, N., Bera, L.K., Nguyen, H.S., Rustagi, S.C., Lo, G.Q., Balasubramanian, N., Kwong, D.-L.

    Published in IEEE electron device letters (01-03-2007)
    “…We demonstrate, for the first time, the fabrication of vertically stacked SiGe nanowire (NW) arrays with a fully CMOS compatible technique. Our method uses the…”
    Get full text
    Journal Article
  5. 5

    Probing channel temperature profiles in AlxGa1−xN/GaN high electron mobility transistors on 200 mm diameter Si(111) by optical spectroscopy by Bera, L K, Liu, Y, Bera, M K, Singh, S P, Dolmanan, S B, Tan, H R, Bhat, T N, Chor, E F, Tripathy, S

    Published in Applied physics letters (18-08-2014)
    “…Using micro-Raman and photoluminescence (PL) techniques, the channel temperature profile is probed in AlxGa1-xN/GaN high electron mobility transistors (HEMTs)…”
    Get full text
    Journal Article
  6. 6

    CORRELATIONS BETWEEN THE PRESENCE OF HÜRTHLE CELLS AND CYTOMORPHOLOGICAL FEATURES OF FINE-NEEDLE ASPIRATION BIOPSY IN THYROID NODULES by Stanciu, M, Zaharie, I S, Bera, L G, Cioca, G

    “…The presence of Hürthle cells (HC) in fine needle thyroid biopsy (FNAB) is a real concern for a cytologist and also for an endocrinologist. We aimed to…”
    Get full text
    Journal Article
  7. 7

    Drive-Current Enhancement in Ge n-Channel MOSFET Using Laser Annealing for Source/Drain Activation by Qingchun Zhang, Jidong Huang, Nan Wu, Guoxin Chen, Minghui Hong, Bera, L.K., Chunxiang Zhu

    Published in IEEE electron device letters (01-09-2006)
    “…A gate-first self-aligned Ge nMOSFET with a metal gate and CVD HfO 2 has been successfully fabricated using KrF laser annealing (LA) as dopant-activation…”
    Get full text
    Journal Article
  8. 8

    Tungsten nanocrystals embedded in high- k materials for memory application by Samanta, S. K., Yoo, Won Jong, Samudra, Ganesh, Tok, Eng Soon, Bera, L. K., Balasubramanian, N.

    Published in Applied physics letters (12-09-2005)
    “…The formation of tungsten nanocrystals (W-NCs) on atomic-layer-deposited HfAlO ∕ Al 2 O 3 tunnel oxide was demonstrated for application in a memory device. It…”
    Get full text
    Journal Article
  9. 9

    489 Interleukin Phenotype in Patients with Pfapa by Iurian, SI, Dobrota, L, Iurian, S, Neamtu, ML, Bera, L, Rosenberg, A

    Published in Archives of disease in childhood (01-10-2012)
    “…Background PFAPA is a chronic condition including recurrent fever episodes, aphthous stomatitis, pharyngitis, adenitis. According to a previous study, even…”
    Get full text
    Journal Article
  10. 10

    1737 Epidemiological Aspects of Streptococcal Pharyngeal Infections in Pediatric Population by Iurian, S, Bera, L, Iurian, SI, Mihut, M, Neamtu, ML, Muntean, A

    Published in Archives of disease in childhood (01-10-2012)
    “…Background During last 5 years, we noticed an increasing incidence of scarlet fever and streptococcal pharyngitis in our county. Aims To appreciate the…”
    Get full text
    Journal Article
  11. 11

    Random Telegraph Signal Noise in Gate-All-Around Si-FinFET With Ultranarrow Body by Lim, Y.F., Xiong, Y.Z., Singh, N., Yang, R., Jiang, Y., Chan, D.S.H., Loh, W.Y., Bera, L.K., Lo, G.Q., Balasubramanian, N., Kwong, D.-L.

    Published in IEEE electron device letters (01-09-2006)
    “…For the first time, the random telegraph signal (RTS) and its corresponding flicker noise (1/f) were investigated in gate-all-around p-type Si-FinFETs. For a…”
    Get full text
    Journal Article
  12. 12

    ORBITAL PSEUDOTUMOR CAN MIMIC GRAVES' OPHTHALMOPATHY by Stanciu, M, Popa, F L, Totoian, I G, Bera, L G

    “…Orbital pseudotumor (OP) is a benign inflammatory process of the orbit with a large polymorphous lymphoid infiltrate, associated with fibrosis in variable…”
    Get full text
    Journal Article
  13. 13

    Three-Layer laminated metal gate electrodes with tunable work functions for CMOS applications by Bai, W.P., Bae, S.H., Wen, H.C., Mathew, S., Bera, L.K., Balasubramanian, N., Yamada, N., Li, M.F., Kwong, D.-L.

    Published in IEEE electron device letters (01-04-2005)
    “…This letter presents a novel technique for tuning the work function of a metal gate electrode. Laminated metal gate electrodes consisting of three ultrathin…”
    Get full text
    Journal Article
  14. 14

    Formation of hafnium-aluminum-oxide gate dielectric using single cocktail liquid source in MOCVD process by Moon Sig Joo, Byung Jin Cho, Chia Ching Yeo, Siu Hung Chan, D., Sung Jin Whoang, Mathew, S., Kanta Bera, L., Balasubramanian, N., Dim-Lee Kwong

    Published in IEEE transactions on electron devices (01-10-2003)
    “…We demonstrate that a high quality metal organic chemical vapor deposition (MOCVD) HfAl/sub x/O/sub y/ (hereafter HfAlO) dielectric film can successfully be…”
    Get full text
    Journal Article
  15. 15

    Variation in the ATP-binding cassette transporter 2 gene is a separate risk factor for systemic lupus erythematosus within the MHC by Ramos, P S, Langefeld, C D, Bera, L A, Gaffney, P M, Noble, J A, Moser, K L

    Published in Genes and immunity (01-06-2009)
    “…The ATP-binding cassette transporter (TAP) proteins are functionally relevant candidates for predisposition to systemic lupus erythematosus (SLE) by virtue of…”
    Get full text
    Journal Article
  16. 16

    A dual-strained CMOS structure through simultaneous formation of relaxed and compressive strained-SiGe-on-insulator by Bera, L.K., Mukherjee-Roy, M., Abidha, B., Agarwal, A., Loh, W.Y., Tung, C.H., Kumar, R., Trigg, A.D., Foo, Y.L., Tripathy, S., Lo, G.Q., Balasubramanian, N., Kwong, D.L.

    Published in IEEE electron device letters (01-05-2006)
    “…This letter reports on an integration of dual-strained surface-channel CMOS structure, i.e., tensile-strained Si n-MOSFET and compressive strained-SiGe…”
    Get full text
    Journal Article
  17. 17

    The impact of uniform strain applied via bonding onto plastic substrate on MOSFET performance by Bera, L.K., Loh, W.Y., Guo, L.H., Zhang, X.W., Lo, G.Q., Balasubramanian, N., Kwong, D.-L.

    Published in IEEE electron device letters (01-01-2006)
    “…For the first time, this letter presents a novel post-backend strain applying technique and the study of its impact on MOSFET device performance. By bonding…”
    Get full text
    Journal Article
  18. 18

    Bendability of single-crystal Si MOSFETs investigated on flexible substrate by Li, H.Y., Guo, L.H., Loh, W.Y., Bera, L.K., Zhang, Q.X., Hwang, N., Liao, E.B., Teoh, K.W., Chua, H.M., Shen, Z.X., Cheng, C.K., Lo, G.Q., Balasubramanian, N., Kwong, D.-L.

    Published in IEEE electron device letters (01-07-2006)
    “…This letter reports on a device layer transfer (based on thermal bonding and grinding backside Si) process and device characteristics of Si MOSFETs on a…”
    Get full text
    Journal Article
  19. 19

    Analysis of carrier generation lifetime in strained-Si/SiGe heterojunction MOSFETs from capacitance transient by Bera, L.K., Mathew, Shajan, Balasubramanian, N., Braithwaite, G., Currie, M.T., Singaporewala, F., Yap, J., Hammond, R., Lochtefeld, A., Bulsara, M.T., Fitzgerald, E.A.

    Published in Applied surface science (15-03-2004)
    “…Carrier generation lifetime ( τ g) in strained-Si/SiGe has been investigated using capacitance transient method in MOS structure. Interface properties of…”
    Get full text
    Journal Article Conference Proceeding
  20. 20

    Improving glycaemic control of patients with Type 2 diabetes in a primary care setting: a French application of the Staged Diabetes Management programme by Varroud-Vial, M., Simon, D., Attali, J., Durand-Zaleski, I., Bera, L., Attali, C., Letondeur, C., Strauss, K., Petit, C., Charpentier, G.

    Published in Diabetic medicine (01-06-2004)
    “…Aims  To assess the impact of a French adaptation of the Staged Diabetes Management (SDM) programme on glycaemic control of people with Type 2 diabetes in…”
    Get full text
    Journal Article