Search Results - "Benkovská, J"
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Investigation of deep energy levels in heterostructures based on GaN by DLTS
Published in The Eighth International Conference on Advanced Semiconductor Devices and Microsystems (01-10-2010)“…In this paper we report our results of DLTS investigations of deep-level defects in Schottky-gate AlGaN/GaN LP-MOVPE structures grown on sapphire substrate…”
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Defects in schottky diodes based on AlGaN/GaN heterostructures
Published in The Tenth International Conference on Advanced Semiconductor Devices and Microsystems (01-10-2014)“…In this paper, the investigation of four types of Schottky-gate structures prepared by low-pressure metal-organic vapour phase epitaxy on sapphire and 4H-SiC…”
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Radiation hardness of 4H-SiC structuresues
Published in The Tenth International Conference on Advanced Semiconductor Devices and Microsystems (01-10-2014)“…Deep level transient spectroscopy is utilized to investigate radiation induced defects in three types of 4H-SiC Schottky diode structures by combined neutron…”
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4H-SiC Diode with a RuOx and a RuWOx Schottky Contact Irradiated by Fast Electrons
Published in 2006 International Conference on Advanced Semiconductor Devices and Microsystems (01-10-2006)“…The impact of radiation damage on the device performance of 4H-SiC Schottky diodes with a RuO 2 and a RuWO x Schottky contacts, which were irradiated at room…”
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Quo Vadis, e-learning?
Published in 2012 IEEE 10th International Conference on Emerging eLearning Technologies and Applications (ICETA) (01-11-2012)“…The authors show their view on e-learning in the last ten years focusing on situation in Slovakia. Presenting their own experiences, they aim to provide…”
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eLearn central - the journey to e-learning
Published in 2011 14th International Conference on Interactive Collaborative Learning (01-09-2011)“…This article highlights the practical experiences acquired in design, realization and implementation of interactive e-learning project located on the…”
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Electrical characterization of the InAlN/GaN heterostructures by capacitance methods
Published in The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems (01-11-2012)“…This paper highlights the electrical characterization of 4 types of the Schottky structures prepared on InAlN/GaN epi-layer designed for HEMT's with the AlN…”
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