Search Results - "Belz, Jürgen"

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    STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens by Oelerich, Jan Oliver, Duschek, Lennart, Belz, Jürgen, Beyer, Andreas, Baranovskii, Sergei D., Volz, Kerstin

    Published in Ultramicroscopy (01-06-2017)
    “…•We present STEMsalabim, a modern implementation of the multislice algorithm for simulation of STEM images.•Our package is highly parallelizable on…”
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    Journal Article
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    Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging by Beyer, Andreas, Belz, Jürgen, Knaub, Nikolai, Jandieri, Kakhaber, Volz, Kerstin

    Published in Ultramicroscopy (01-10-2016)
    “…Aberration-corrected (scanning) transmission electron microscopy ((S)TEM) has become a widely used technique when information on the chemical composition is…”
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    Journal Article
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    A Small Step for Epitaxy, a Large Step Toward Twist Angle Control in 2D Heterostructures by Maßmeyer, Oliver, Belz, Jürgen, Dogahe, Badrosadat Ojaghi, Widemann, Maximilian, Günkel, Robin, Glowatzki, Johannes, Bergmann, Max, Pasko, Sergej, Krotkus, Simonas, Heuken, Michael, Beyer, Andreas, Volz, Kerstin

    Published in Advanced materials interfaces (01-08-2024)
    “…2D materials have received a lot of interest over the past decade. Especially van der Waals (vdW) 2D materials, such as transition metal dichalcogenides…”
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    Atomic-scale 3D reconstruction of antiphase boundaries in GaP on (001) silicon by STEM by Belz, Jürgen, Beyer, Andreas, Volz, Kerstin

    Published in Micron (Oxford, England : 1993) (01-11-2018)
    “…•Introduction of a method for atomic characterization of complex interfaces.•Simulation data based 3D reconstruction by ADF STEM micrographs.•Application for…”
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    Journal Article
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    Influence of surface relaxation of strained layers on atomic resolution ADF imaging by Beyer, Andreas, Duschek, Lennart, Belz, Jürgen, Oelerich, Jan Oliver, Jandieri, Kakhaber, Volz, Kerstin

    Published in Ultramicroscopy (01-10-2017)
    “…•Surface relaxation of TEM foils leads to bending of lattice planes which influences ADF intensity.•Frozen phonon simulations relaxed super cells with…”
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    Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEM by BEYER, ANDREAS, DUSCHEK, LENNART, BELZ, JÜRGEN, OELERICH, JAN OLIVER, JANDIERI, KAKHABER, VOLZ, KERSTIN

    Published in Journal of microscopy (Oxford) (01-12-2017)
    “…Summary The surfaces of thin transmission electron microscopy (TEM) specimens of strained heterostructures can relax. The resulting bending of the lattice…”
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    Measuring Spatially‐Resolved Potential Drops at Semiconductor Hetero‐Interfaces Using 4D‐STEM by Chejarla, Varun Shankar, Ahmed, Shamail, Belz, Jürgen, Scheunert, Jonas, Beyer, Andreas, Volz, Kerstin

    Published in Small methods (20-09-2023)
    “…Characterizing long‐range electric fields and built‐in potentials in functional materials at nano to micrometer scales is of supreme importance for optimizing…”
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    Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning by Belz, Jürgen, Beyer, Andreas, Torunski, Torsten, Stolz, Wolfgang, Volz, Kerstin

    Published in Ultramicroscopy (01-04-2016)
    “…The introduction of preparation artifacts is almost inevitable when producing samples for (scanning) transmission electron microscopy ((S)TEM). These artifacts…”
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    Journal Article
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