Search Results - "Belous, A.I."

Formation of new materials based on cast aluminum alloy by Usherenko, S. M., Marukovich, E. I., Usherenko, Yu. S., Belous, A. I., Petlitskiic, A. N.

“…We show the dynamic formation of composite materials using the polycrystalline cast alloy Al + 12% Si as the example. The volume fraction of the synthesized…”
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Two-dimensional modelling of diffusion of low-energy implanted arsenic in silicon at rapid thermal annealing by Komarov, F.F., Mironov, A.M., Zayats, G.M., Tsurko, V.A., Velichko, O.I., Komarov, A.F., Belous, A.I.

“…The two-dimensional model of arsenic diffusion in silicon at rapid thermal annealing is presented. A method of solving the nonlinear differential equations…”
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Space dust high-velocity particle influence on electronic equipment by Belous, A.I., Syakersky, V.S., Ovchinnikov, V.I., Buiko, L.D., Petlitskaya, T.V.

“…Determination of failure causes of the control systems and navigation electronic elements of space flying vehicles (SFV), observed in the process of long-time…”
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High-performance CMOS arithmetic coprocessor integral-3C87 by Belous, A.I., Revinsky, E.I.

“…An arithmetic coprocessor design has been realised, meeting the IEEE-754 standard requirement and exceeding the well-known Intel 80387 both in processing…”
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Radiation effects in bipolar and CMOS integrated microcircuits by Korshunov, F.P., Bogatyrev, Yu.V., Belous, A.I., Shwedov, S.V., Lastovsky, S.B., Kulgachev, V.I., Gurinovich, V.A.

“…The results of experimental researches and methods of prediction of radiation resistance of bipolar analog, and also logic CMOS integrated microcircuits are…”
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Hardware-Software Solution for the Development of Multilevel Distributed Information-Measuring and Control Systems by Belous, A.I., Vlasov, V.V., Demchenko, A.I., Yemelyanov, V.A., Syakerskiy, V.S.

“…The results of efforts focused on the development of up-to-date microprocessor data and control systems using domestic componentry, while offering the same…”
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Maintenance of Serviceability of Various Perspective Semiconductor Devices at Radiation Influence by Korshunov, F.P., Bogatyrev, Yu.V., Belous, A.I., Shwedov, S.V., Golubev, N.F., Lastovsky, S.B., Kulgachev, V.I.

“…The results of experimental researches, methods of prediction and increase of radiation resistance of logic CMOS integrated microcircuits, MOS memory…”
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