Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical facto...

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Bibliographic Details

Published in:	2022 IEEE European Test Symposium (ETS) pp. 1 - 10
Main Authors:	Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., Reorda, M. Sonza, Sterpone, L., Tancorre, V., Ugioli, R.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 23-05-2022
Subjects:	DNNs reliability Inter-wafer performance variation estimation SLT-BI automatic test equipment
Online Access:	Get full text
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