Search Results - "Bellan, Ivan" :: Katalog Arama

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Acoustic spectroscopy and electrical characterization of Si/NAOS-SiO2/HfO2 structures by Bury, Peter, Matsumoto, Taketoshi, Bellan, Ivan, Janek, Marián, Kobayashi, Hikaru

Published in Applied surface science (15-03-2013)
“…The MOS structure prepared on n-type Si substrate with SiO2/HfO2 gate dielectric layers was formed by 5nm HfO2 oxide deposited by atomic layer deposition on…”

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Determination of the Position of a Tectonic Dislocation in the Shape of a Line, which is Radiating Gamma Rays by Virdzek, Pavel, Bellan, Ivan, Sidor, Peter, Kostrova, Jela

Published in Advances in electrical and electronic engineering (01-12-2005)
“…In the present paper we describe a computation of the position of a tectonic dislocation in the shape of a line, which is radiating gamma rays. We derive the…”

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Investigation of Interface States in Si/NAOS-SiO2/HfO2 Structures Using Complete Acoustic Spectroscopy by Peter Bury, Taketoshi Matsumoto, Stefan Hardon, Ivan Bellan, Marian Janek, Hikaru Kobayashi

Published in Komunikácie : vedecké listy Žilinskej univerzity = Communications : scientific letters of the University of Žilina (28-02-2014)
“…The set of MOS structures formed on n-type Si substrate with (NAOS)-SiO2/HfO2 gate dielectric layers was prepared and annealed in N2 atmosphere at various…”

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