Search Results - "Behner, U."

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    Comparison of different [formula omitted] alloy buffer concepts for (Si mGe n) p superlattices by Dettmer, K., Behner, U., Beserman, R.

    Published in Journal of crystal growth (01-12-1995)
    “…Fully relaxed buffers of final Ge concentration x f are needed to grow strain-symmetrized superlattices. Different concepts of such a buffer of step graded,…”
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    Journal Article
  3. 3

    1/f noise in conductive adhesive bonds under mechanical stress as a sensitive and fast diagnostic tool for reliability assessment by Vandamme, L K J, Perichaud, M G, Noguera, E, Danto, Y, Behner, U

    Published in Microelectronics and reliability (1999)
    “…Classical lifetime predictions of conductive adhesive bonds require time consuming thermal cycling measurements. Therefore, faster lifetime test are needed…”
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    Journal Article
  4. 4

    1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds by Vandamme, L.K.J., Perichaud, M.G., Noguera, E., Danto, Y., Behner, U.

    “…Reliability assessment of conductive adhesive bonds by thermo-cycling up to 830 cycles is time consuming, and does not give much information about the details…”
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    Journal Article
  5. 5

    Characterization of anisotropically conductive adhesive interconnections by 1/f noise measurements by Behner, U., Haug, R., Schutz, R., Hartnagel, H.L.

    “…There is growing interest in using anisotropically conductive adhesives (ACAs) not only for interconnections between LCDs and PCBs but also in higher current…”
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    Conference Proceeding
  6. 6

    Characterization of anisotropically conductive adhesive interconnections by 1/f noise measurements by Behner, U., Haug, R., Schutz, R., Hartnagel, H.L.

    “…Today there is growing interest in using anisotropically conductive adhesives (ACAs) not only for interconnections between liquid crystal displays and printed…”
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    Journal Article
  7. 7

    [formula omitted] Noise in conductive adhesive bonds under mechanical stress as a sensitive and fast diagnostic tool for reliability assessment by Vandamme, L.K.J., Perichaud, M.G., Noguera, E., Danto, Y., Behner, U.

    Published in Microelectronics and reliability (01-06-1999)
    “…Classical lifetime predictions of conductive adhesive bonds require time consuming thermal cycling measurements. Therefore, faster lifetime test are needed…”
    Get full text
    Journal Article
  8. 8

    Low-cost direct chip attach: comparison of SMD compatible FC soldering with anisotropically conductive adhesive FC bonding by Haug, R., Behner, R., Czaya, C.-P., Hongquan Jiang, Kotthaus, S.F., Schuetz, R., Treutler, C.P.O.

    “…Small modules on the basis of laminate substrates are often used as a functional subunit in electronic applications. Currently most of them are made by chip…”
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    Journal Article
  9. 9

    Micromachined pressure sensors with Al/sub x/Ga/sub 1-x/As/GaAs- and InAs/AlSb/GaSb-resonant tunneling diodes by Mutamba, K., Sigurdardottir, A., Vogt, A., Pfeiffer, J., Behner, U., Di Carlo, A., Hartnagel, H.L.

    “…We report on the development of micromachined pressure sensors utilizing uniaxial pressure effects in resonant tunneling diodes (RTDs) made from the material…”
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    Conference Proceeding
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    Low-cost direct chip attach: Comparison of SMD compatible FC soldering with anisotropically conductive adhesive FC bonding by Behner, U., Czaya, C.-P., Haug, R., Hauschild, F.-D., Jiang, H., Kaloudis, M., Kotthaus, S., Kuschel, S., Schuetz, R., Schultze, F., Treutler, C.P.O., Vogel, W.

    “…Small modules based on laminate substrates are often used as a functional subunit in electronic applications. Most of them are made by chip and wire techniques…”
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    Conference Proceeding