Search Results - "Barton, Daniel L."

Active Vertex Model for cell-resolution description of epithelial tissue mechanics by Barton, Daniel L, Henkes, Silke, Weijer, Cornelis J, Sknepnek, Rastko

“…We introduce an Active Vertex Model (AVM) for cell-resolution studies of the mechanics of confluent epithelial tissues consisting of tens of thousands of…”
Get full text

Data-driven modelling makes quantitative predictions regarding bacteria surface motility by Barton, Daniel L, Chang, Yow-Ren, Ducker, William, Dobnikar, Jure

“…In this work, we quantitatively compare computer simulations and existing cell tracking data of P. aeruginosa surface motility in order to analyse the…”
Get full text

JABAWS 2.2 distributed web services for Bioinformatics: protein disorder, conservation and RNA secondary structure by Troshin, Peter V, Procter, James B, Sherstnev, Alexander, Barton, Daniel L, Madeira, Fábio, Barton, Geoffrey J

“…Abstract Summary JABAWS 2.2 is a computational framework that simplifies the deployment of web services for Bioinformatics. In addition to the five multiple…”
Get full text

Single-quantum well InGaN green light emitting diode degradation under high electrical stress by Barton, Daniel L., Osinski, Marek, Perlin, Piotr, G. Eliseev, Petr, Lee, Jinhyun

“…We performed a degradation study of high-brightness Nichia single-quantum well AlGaN/InGaN/GaN green light-emitting diodes (LEDs). The devices were subjected…”
Get full text

AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress by Osiński, Marek, Zeller, Joachim, Chiu, Pei-Chih, Scott Phillips, B., Barton, Daniel L.

“…This study focused on the performance of commercial AlGaN/InGaN/GaN blue light emitting diodes (LEDs) under high current pulse conditions. The results of deep…”
Get full text

Effects of high electrical stress on GaN/InGaN/AlGaN single-quantum-well light-emitting diodes by Osiński, Marek, Barton, Daniel L, Perlin, Piotr, Lee, Jinhyun

“…We report on high-electrical-stress testing of Nichia GaN/InGaN/AlGaN single-quantum-well (SQW) light-emitting diodes. In contrast to our earlier experiments…”
Get full text

Local thermal probing to detect open and shorted IC interconnections by Cole, Edward I., Tangyunyong, Paiboon, Barton, Daniel L.

“…A new failure analysis technique has been developed for backside and frontside localization of open and shorted interconnections on ICs. This scanning optical…”
Get full text

Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects by Cole, E.I., Soden, J.M., Tangyunyong, P., Candelaria, P.L., Beegle, R.W., Barton, D.L., Henderson, C.L., Hawkins, C.F.

“…Transient power supply voltage (V/sub DDT/) analysis is a new testing technique demonstrated as a powerful alternative and complement to I/sub DDQ/ testing…”
Get full text

PII: S0026-2714(01)00102-0 by Barton, Daniel L, Nakajima, Shigeru, Vanzi, Massimo

Get full text

Active Vertex Model for Cell-Resolution Description of Epithelial Tissue Mechanics by Barton, Daniel L, Henkes, Silke, Weijer, Cornelis J, Sknepnek, Rastko

“…We introduce an Active Vertex Model (AVM) for cell-resolution studies of the mechanics of confluent epithelial tissues consisting of tens of thousands of…”
Get full text

Backside localization of open and shorted IC interconnections by Cole, E.I. Jr, Tangyunyong, P., Barton, D.L.

“…A new failure analysis technique has been developed for backside and frontside localization of open and shorted interconnections on ICs. This scanning optical…”
Get full text

Novel MCM Interconnection Analysis Using Capacitive Charge Generation (CCG) by Cole, E.I., Peterson, K.A., Barton, D.L.

Get full text

Novel failure analysis techniques using photon probing with a scanning optical microscope by Cole, E.I., Soden, J.M., Rife, J.L., Barton, D.L., Henderson, C.L.

“…Three new failure analysis techniques for integrated circuits (ICs) have been developed using localized photon probing with a scanning optical microscope…”
Get full text

Optical tools and techniques for failure analysis of modern integrated circuits by Cole, E.I., Bruce, M.R., Barton, D.L., Tangyunyong, P., Bruce, V.J., Hawkins, C.F., Soden, J.M., Henderson, C.L., Ring, R.M., Chong, W.-L., Eppes, D.H., Wilcox, J., Benson, D.A.

“…Defect localization in modern ICs can be extremely challenging. To address this complexity several optically based methodologies have been developed over the…”
Get full text

Degradation of single-quantum well InGaN green light emitting diodes under high electrical stress by Barton, D.L., Osinski, M., Perlin, P., Eliseev, P.G., Lee, J.

“…We performed a degradation study of high-brightness Nichia single-quantum well AlGaN-InGaN-GaN green light-emitting diodes (LEDs). The devices were subjected…”
Get full text