Search Results - "Barrett, N. T"

Modeling the XPS Si 2p core-level intensities of silicon nanocrystals for determination of oxide shell thickness by Renault, O., Marlier, R., Barrett, N. T., Martinez, E., Baron, T., Gely, M., De Salvo, B.

“…We have developed a simplified model of the core and oxide shell XPS intensities of 5‐nm diameter Si nanocrystals for determining the shell thickness. The…”
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Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al2O3∕Si surfaces by Renault, O., Marlier, R., Gely, M., De Salvo, B., Baron, T., Hansson, M., Barrett, N. T.

“…Synchrotron radiation x-ray photoelectron spectroscopy is used for the study of 5 nm Si nanocrystals (NCs) for applications in nonvolatile memory devices. A…”
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Electronic structure of Al- and Ga-doped ZnO films studied by hard X-ray photoelectron spectroscopy by Gabás, M., Torelli, P., Barrett, N. T., Sacchi, M., Ramos Barrado, José R.

“…Al- and Ga-doped sputtered ZnO films (AZO, GZO) are semiconducting and metallic, respectively, despite the same electronic valence structure of the dopants…”
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Chemical and electronic interface structure of spray pyrolysis deposited undoped and Al-doped ZnO thin films on a commercial Cz-Si solar cell substrate by Gabás, M., Barrett, N.T., Ramos-Barrado, J.R., Gota, S., Rojas, T.C., López-Escalante, M.C.

“…We have studied differences in the interface between undoped and Al-doped ZnO thin films deposited on commercial Si solar cell substrates. The undoped ZnO film…”
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A core-level photoemission spectroscopy study of the formation of surface alloy Cu/Pt(111): comparison with Pt/Cu(111) by Barrett, N.T., Belkhou, R., Thiele, J., Guillot, C.

“…We present first results on the formation of a surface alloy starting from the deposition of thin Cu films on a Pt(111) substrate. Annealing at 300°C leads to…”
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Glancing-angle x-ray absorption spectroscopy of corroded borosilicate glass surfaces containing uranium by Greaves, G. N, Barrett, N. T, Antonini, G. M, Thornley, F. R, Willis, B. T. M, Steel, A

“…The local atomic structure surrounding uranium in borosilicate glass has been investigated by fluorescence x-ray absorption spectroscopy. By employing angles…”
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Band offsets of nitrided ultrathin hafnium silicate films by Barrett, N. T., Renault, O., Besson, P., Le Tiec, Y., Martin, F.

“…Photoemission spectroscopy using synchrotron radiation was used to determine the band offsets, as a function of depth, of ultrathin ( 3.5 nm ) Hf-silicate…”
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Electronics of the SiO2/HfO2 interface by soft X-ray photoemission spectroscopy by Renault, O., Barrett, N.T., Samour, D., Quiais-Marthon, S.

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Kerr study of Pt/Co/Pt(111) sandwiches by Thiele, J., Ferré, J., Meyer, P., Guillot, C., Belkhou, R., Barrett, N.T.

“…We report the magnetic properties of ultrathin cobalt Pt/Co/Pt (111) sandwich films measured by magneto-optical Kerr effect. Magnetic after-effect relaxation…”
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X-ray analysis of changes to the atomic structure around Ni associated with the interdiffusion and mechanical alloying of pure Ni and Mo powders by COCCO, G, ENZO, S, BARRETT, N. T, ROBERTS, K. J

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Development of a novel tunnel dismantling machine for the MTR West Island Line construction by Ng, P L, Polycarpe, S, Barrett, T N D R, Roux, G, Vallon, F

“…The MTR West Island Line (WIL) Contract No. 703 from the Sheung Wan Station (SHW) tunnel to the Sai Ying Pun Station (SYP) tunnel is part of the extension of…”
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Structure and growth mode of epitaxial Co/Au(111) magnetic thin films by Belkhou, R., Marsot, N., Magnan, H., Le Fèvre, P., Barrett, N.T., Guillot, C., Chandesris, D.

“…The growth mode and the structure of Co layers deposited at room temperature (RT) on a Au(111) single crystal has been studied using core level photoemission…”
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Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al 2 O 3 ∕ Si surfaces by Renault, O., Marlier, R., Gely, M., De Salvo, B., Baron, T., Hansson, M., Barrett, N. T.

“…Synchrotron radiation x-ray photoelectron spectroscopy is used for the study of 5 nm Si nanocrystals (NCs) for applications in nonvolatile memory devices. A…”
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Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy by Gabás, Mercedes, Gota, Susana, Ramos-Barrado, José Ramón, Sánchez, Miguel, Barrett, Nicholas T., Avila, José, Sacchi, Maurizio

“…We report on the correlation between the electrical behavior and valence band spectra of undoped and Al-doped ZnO films, obtained by using x-ray photoelectron…”
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HfO 2 / SiO 2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy by Renault, O., Samour, D., Damlencourt, J.-F., Blin, D., Martin, F., Marthon, S., Barrett, N. T., Besson, P.

“…X-ray photoelectron spectroscopy using synchrotron radiation has been used to investigate the HfO2/SiO2 interface chemistry of high-quality 0.6 and 2.5 nm…”
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Electronics of the SiO2/HfO2 interface by soft X-ray photoemission spectroscopy by RENAULT, O, BARRETT, N. T, SAMOUR, D, QUIAIS-MARTHON, S

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Response to "Comment on 'Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft X-ray photoemission' " [ Appl. Phys. Lett. 86 , 216101 ( 2005 ) ] by Gabás, Mercedes, Gota, Susana, Ramos-Barrado, José Ramón, Sánchez, Miguel, Barrett, Nicholas T., Avila, José, Sacchi, Maurizio

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X-Ray Analysis of Changes to the Atomic Structure Around Nickel Associated With the Interdiffusion and Mechanical Alloying of Pure Nickel and Molybdenum Powders by Cocco, G, Enzo, S, Barrett, N T, Roberts, K J

“…A combination of X-ray diffraction and X-ray-absorption spectroscopy was applied to probe, in a self-consistent way, the bulk and local structural changes,…”
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