Search Results - "Barr, D.L."

A 2 million transistor digital processor with 120 nm gates fabricated by 248 nm wavelength phase shift technology by Watson, G.P., Kizilyalli, I.C., Miller, M., Wang, Y.T., Pati, B., Cirelli, R.A., Nalamasu, O., Radosevich, J., Kohler, R., Freyman, R., Baumann, F., Klemens, F., Mansfield, W., Vaidya, H., Frackoviak, J., Timko, A., Barr, D.L., Bolan, K.

“…Alternating phase shift technology has been shown to substantially improve focus latitude and resolution for several years. However, the use of phase shift…”
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Thinning of Si in SOI wafers by the SC1 standard clean by Celler, G.K., Barr, D.L., Rosamilia, J.M.

“…SOI structures are becoming progressively thinner as device dimensions are scaled down. Although thinner layers of Si and SiO/sub 2/ can be made directly by…”
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Anticipated performance of achromatic quadrupole focusing systems when used with liquid metal ion sources by Harriott, L. R., Brown, W. L., Barr, D. L.

“…Current focusing systems for producing finely focused ion beams from liquid metal ion sources (LMIS) using axially symmetric electrostatic lenses are limited…”
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Contrast formation in focused ion beam images of polycrystalline aluminum by Barr, D. L., Brown, W. L.

“…Focused ion beam secondary electron images of polycrystalline aluminum films are valuable in revealing the grain structure of the films with great clarity on a…”
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Multi-service optical node based on low-loss MEMS optical crossconnect switch by Ryf, R., Neilson, D.T., Kolodner, P.R., Kim, J., Hickey, J.P., Carr, D., Aksyuk, V., Greywall, D.S., Pardo, F., Bolle, C., Frahm, R., Basavanhally, N.R., Ramsey, D.A., George, R., Kraus, J., Lichtenwalner, C., Papazian, R., Nuzman, C., Weiss, A., Kumar, B., Lieuwen, D., Gates, J., Shea, H.R., Gasparyan, A., Lifton, V.A., Prybyla, J.A., Goyal, S., Ruel, R., Nijander, C., Arney, S., Bishop, D.J., Giles, C.R., Pau, S., Mansfield, W.M., Jin, S., Lai, W.Y., Barr, D.L., Cirelli, R.A., Bogart, G.R., Teffeau, K., Vella, R., Ramirez, A., Klemens, F.P., Liu, J.Q., Rosamilia, J.M., Soh, H.T., Lee, T.C.

“…In summary, a multi-service node based on an optical MEMS crossconnect switch with 1.33 dB mean loss has been demonstrated. While a simple 16-wavelength,…”
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1296-port MEMS transparent optical crossconnect with 2.07 petabit/s switch capacity by Ryf, R., Kim, J., Hickey, J.P., Gnauck, A., Carr, D., Pardo, F., Bolle, C., Frahm, R., Basavanhally, N., Yoh, C., Ramsey, D., Boie, R., George, R., Kraus, J., Lichtenwalner, C., Papazian, R., Gates, J., Shea, H.R., Gasparyan, A., Muratov, V., Griffith, J.E., Prybyla, J.A., Goyal, S., White, C.D., Lin, M.T., Ruel, R., Nijander, C., Arney, S., Neilson, D.T., Bishop, D.J., Kolodner, P., Pau, S., Nuzman, C., Weis, A., Kumar, B., Lieuwen, D., Aksyuk, V., Greywall, D.S., Lee, T.C., Soh, H.T., Mansfield, W.M., Jin, S., Lai, W.Y., Huggins, H.A., Barr, D.L., Cirelli, R.A., Bogart, G.R., Teffeau, K., Vella, R., Mavoori, H., Ramirez, A., Ciampa, N.A., Klemens, F.P., Morris, M.D., Boone, T., Liu, J.Q., Rosamilia, J.M., Giles, C.R.

“…A 1296-port MEMS transparent optical crossconnect with 5.1dB/spl plusmn/1.1dB insertion loss at 1550 nm is reported. Measured worst-case optical crosstalk in a…”
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Regional cerebral blood flow in schizophrenia by Mathew, R J, Duncan, G C, Weinman, M L, Barr, D L

“…Regional cerebral blood flow (rCBF) was measured via xenon133 inhalation technique in 23 patients with schizophrenia and 18 age- and sex-matched controls. The…”
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A study of time and angle correlations in the ion emission from gallium liquid metal ion sources by Barr, D. L., Thomson, D. J., Brown, W. L.

“…An ion streak camera has been constructed for measurement of time and angle correlations in ion emission from liquid‐metal ion sources. Emission events are…”
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