The effect of bending radius on V-I characteristics of mono- and multicored BiPb-2223 tapes with and without Ag additions

The effect of bending strain on Voltage-Current Characteristics (VCC) of BiPbSrCaCuO-2223/(Ag and Ag-alloy sheathed) tapes with and without Ag additions into the core have been studied. The testing probe allows us to carry out all set of bending tests up to radius 5 mm on the same specimen. The crit...

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Bibliographic Details
Published in:	IEEE transactions on applied superconductivity Vol. 7; no. 2; pp. 1323 - 1326
Main Authors:	Akimov, I.I., Antipova, E.V., Barabanov, S.N., Kozlenkova, N.I., Kuznetsov, P.A., Nikulin, A.D., Rakov, D.N., Shikov, A.K., Khlebova, N.E., Filitchev, D.A.
Format:	Journal Article Conference Proceeding
Language:	English
Published:	New York, NY IEEE 01-06-1997 Institute of Electrical and Electronics Engineers
Subjects:	Capacitive sensors Conducting materials Degradation Magnetic field measurement Multicore processing Powders Shape Silver Testing Voltage
Online Access:	Get full text
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Summary:	The effect of bending strain on Voltage-Current Characteristics (VCC) of BiPbSrCaCuO-2223/(Ag and Ag-alloy sheathed) tapes with and without Ag additions into the core have been studied. The testing probe allows us to carry out all set of bending tests up to radius 5 mm on the same specimen. The critical current Ic and shape of high-sensitivity VCC as a function of bending strain are analysed. Degradation of current carrying capacity under bending deformation is caused by the formation of microcracks. The overlapping of microcracks in Bi-2223/Ag sheathed tapes without Ag additions leads to current overflow into the Ag sheath and to appearance of linear resistance segment in the V-I curve at low electric field.
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	1051-8223 1558-2515
DOI:	10.1109/77.620769