Search Results - "Bangs, J.W."

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  1. 1

    Higher Dislocation Density of Arsenic-Doped HgCdTe Material by Vilela, M.F., Olsson, K.R., Rybnicek, K., Bangs, J.W., Jones, K.A., Harris, S.F., Smith, K.D., Lofgreen, D.D.

    Published in Journal of electronic materials (01-08-2014)
    “…There is a well-known direct negative correlation between dislocation density and optoelectronic device performance. Reduction in detector noise associated…”
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    Journal Article Conference Proceeding
  2. 2

    MBE Growth of HgCdTe on Large-Area Si and CdZnTe Wafers for SWIR, MWIR and LWIR Detection by Reddy, M., Peterson, J.M., Lofgreen, D.D., Franklin, J.A., Vang, T., Smith, E.P.G., Wehner, J.G.A., Kasai, I., Bangs, J.W., Johnson, S.M.

    Published in Journal of electronic materials (01-09-2008)
    “…Molecular beam epitaxy (MBE) growth of HgCdTe on large-size Si (211) and CdZnTe (211)B substrates is critical to meet the demands of extremely uniform and…”
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    Journal Article Conference Proceeding
  3. 3

    Status of HgCdTe-MBE technology for producing dual-band infrared detectors by Rajavel, R.D, Brewer, P.D, Jamba, D.M, Jensen, J.E, LeBeau, C, Olson, G.L, Roth, J.A, Williamson, W.S, Bangs, J.W, Goetz, P, Johnson, J.L, Patten, E.A, Wilson, J.A

    Published in Journal of crystal growth (01-06-2000)
    “…Progress on achieving reproducible growth of high performance, dual-band IR detector structures in HgCdTe grown by molecular beam epitaxy (MBE) is described…”
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    Journal Article