Amorphous optical coatings of present gravitational-wave interferometers
Class. Quantum Grav. 37 (2020) 095004 We report on the results of an extensive campaign of optical and mechanical characterization of the ion-beam sputtered oxide layers (Ta$_2$O$_5$, TiO$_2$, Ta$_2$O$_5$-TiO$_2$, SiO$_2$) within the high-reflection coatings of the Advanced LIGO, Advanced Virgo and...
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Main Authors: | , , , , , , , , , , , , |
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Format: | Journal Article |
Language: | English |
Published: |
09-09-2019
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Subjects: | |
Online Access: | Get full text |
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Summary: | Class. Quantum Grav. 37 (2020) 095004 We report on the results of an extensive campaign of optical and mechanical
characterization of the ion-beam sputtered oxide layers (Ta$_2$O$_5$, TiO$_2$,
Ta$_2$O$_5$-TiO$_2$, SiO$_2$) within the high-reflection coatings of the
Advanced LIGO, Advanced Virgo and KAGRA gravitational-wave detectors:
refractive index, thickness, optical absorption, composition, density, internal
friction and elastic constants have been measured; the impact of deposition
rate and post-deposition annealing on coating internal friction has been
assessed. For Ta$_2$O$_5$ and SiO$_2$ layers, coating internal friction
increases with the deposition rate, whereas the annealing treatment either
erases or largely reduces the gap between samples with different deposition
history. For Ta$_2$O$_5$-TiO$_2$ layers, the reduction of internal friction due
to TiO$_2$ doping becomes effective only if coupled with annealing. All
measured samples showed a weak dependence of internal friction on frequency
($\phi_c(f) = af^{b}$, with $-0.208 < b < 0.140$ depending on the coating
material considered). SiO$_2$ films showed a mode-dependent loss branching,
likely due to spurious losses at the coated edge of the samples. The reference
loss values of the Advanced LIGO and Advanced Virgo input (ITM) and end (ETM)
mirror HR coatings have been updated by using our estimated value of Young's
modulus of Ta$_2$O$_5$-TiO$_2$ layers (120 GPa) and are about 10\% higher than
previous estimations. |
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DOI: | 10.48550/arxiv.1909.03737 |