Search Results - "Balk, L.J"

Diagnosing and quantifying a common deficit in multiple sclerosis: Internuclear ophthalmoplegia by Nij Bijvank, J.A, van Rijn, L.J, Balk, L.J, Tan, H.S, Uitdehaag, B.M.J, Petzold, A

“…OBJECTIVEWe present an objective and quantitative approach for diagnosing internuclear ophthalmoplegia (INO) in multiple sclerosis (MS). METHODSA validated…”
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Impaired saccadic eye movements in multiple sclerosis are related to altered functional connectivity of the oculomotor brain network by Nij Bijvank, J.A., Strijbis, E.M.M., Nauta, I.M., Kulik, S.D., Balk, L.J., Stam, C.J., Hillebrand, A., Geurts, J.J.G., Uitdehaag, B.M.J., van Rijn, L.J., Petzold, A., Schoonheim, M.M.

“…•Impaired eye movements in multiple sclerosis (MS) and functional connectivity (FC)•Eye movements related to altered FC of the oculomotor brain network.•Lower…”
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Ferroelectric domain structures in (Pb,La)(Zr,Ti)O 3 ceramics observed by scanning force microscopy in acoustic mode by Li, G.R., Zeng, H.R., Liu, X.X., Heiderhoff, R., Balk, L.J., Yin, Q.R.

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Failure analysis of integrated devices by scanning thermal microscopy (SThM) by Fiege, G.B.M., Feige, V., Phang, J.C.H, Maywald, M., Gorlich, S., Balk, L.J.

“…High power densities dissipated in smaller and faster devices are leading to major thermal problems of semiconductor devices. The resulting local heat…”
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Saccadic delay in multiple sclerosis: A quantitative description by Nij Bijvank, J.A., Petzold, A., Coric, D., Tan, H.S., Uitdehaag, B.M.J., Balk, L.J., van Rijn, L.J.

“…In multiple sclerosis (MS), eye movement disorders are common and can be quantified with infrared video-oculography. A well-known abnormality is internuclear…”
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Saccadic fatigability in the oculomotor system by Nij Bijvank, J.A., van Rijn, L.J., Kamminga, M., Tan, H.S., Uitdehaag, B.M.J., Petzold, A., Balk, L.J.

“…Fatigue is one of the most common and disabling symptoms in multiple sclerosis (MS), but challenging to quantify. This prospective study investigated if…”
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Sub-surface analyses of defects in integrated devices by scanning probe acoustic microscopy by Cramer, R.M., Biletzki, V., Lepidis, P., Balk, L.J.

“…Acoustical analyses of integrated devices have been performed at the nanometer level by the detection of acoustical waves locally generated by a modulation of…”
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Long-term disease activity and disability progression in relapsing-remitting multiple sclerosis patients on natalizumab by Dekker, I., Leurs, C.E., Hagens, M.H.J., van Kempen, Z.L.E., Kleerekooper, I., Lissenberg-Witte, B.I., Barkhof, F., Uitdehaag, B.M.J., Balk, L.J., Wattjes, M.P., Killestein, J.

“…•A long disease duration at natalizumab initiation predicts earlier EDSS progression.•A higher pre-baseline relapse rate predicts a longer NEPAD…”
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Acid sphingomyelinase: No potential as a biomarker for multiple sclerosis by Leurs, C E, Lopes Pinheiro, M A, Wierts, L, den Hoedt, S, Mulder, M T, Eijlers, A J C, Schoonheim, M M, Balk, L J, Uitdehaag, B M J, Killestein, J, de Vries, H E

“…Multiple sclerosis (MS) lacks reliable biomarkers that reflect disease activity. Recent evidence suggests that an altered sphingolipid metabolism is associated…”
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Editorial by Balk, L.J., Gerling, W.H., Wolfgang, E.

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Design of Avalanche Capability of Power MOSFETs by Device Simulation by Pawel, I., Siemieniec, R., Rosch, M., Hirler, F., Geissler, C., Pugatschow, A., Balk, L.J.

“…The avalanche behavior of new 150 V trench power MOSFETs was designed with the help of two- dimensional device simulation techniques. The devices employ the…”
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Characterization of electronic materials and devices by scanning near-field microscopy by Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch

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Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques by Fakhri, M., Geinzer, A.-K., Heiderhoff, R., Balk, L.J.

“…Thermally induced stress is determined using boundary values obtained by complementary Scanning Joule Expansion Microscopy and Scanning Thermal Microscopy. The…”
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Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations by Pugatschow, A., Heiderhoff, R., Balk, L.J.

“…Time resolved investigations of electric field distributions in the near-surface regions of a dynamically biased power device using spectral EBIC microscopy…”
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Determination of the electric field distribution within multi-quantum-well light emitting diodes by the use of electron beam induced methods by Geinzer, T., Heiderhoff, R., Balk, L.J.

“…Dynamic electron beam induced methods are applied to determine the local electrical field distribution of devices with small depletion regions. The dissipation…”
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Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations by Tiedemann, A.-K., Kurz, K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J.

“…Thermo-elastic properties on aluminum interconnects are characterized by Scanning Joule Expansion Microscopy and complementary finite element analyses…”
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Near-field detection of photon emission from silicon with 30 nm spatial resolution by Isakov, D., Tio, A.A.B., Geinzer, T., Phang, J.C.H., Zhang, Y., Balk, L.J.

“…We demonstrate a scanning near-field photon emission microscope (SNPEM) for monitoring photon emission sites with spatial resolution beyond the diffraction…”
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Dynamic characterization of ferroelectric domains of BaTiO 3 by scanning near-field acoustic microscopy by Liu, X.X., Heiderhoff, R., Abicht, H.P., Balk, L.J.

“…Scanning near-field acoustic microscopy (SNAM) investigations on BaTiO 3 allows a non-destructive characterization of the ferroelectric properties at a spatial…”
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Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM/ESEM-hybrid-system by Tiedemann, A.-K., Heiderhoff, R., Balk, L.J., Phang, J.C.H.

“…A hybrid-system consisting of a scanning thermal microscope and an environmental scanning electron microscope is used to analyze directional thermal…”
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Editorial by Balk, L.J., Wolfgang, E., Gerling, W.H.

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