Search Results - "Baliga, J"
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Monolithically Integrated 4H-SiC MOSFET and JBS Diode (JBSFET) Using a Single Ohmic/Schottky Process Scheme
Published in IEEE electron device letters (01-12-2016)“…This letter reports a new 900 V 4H-SiC JBSFET containing an MOSFET with an integrated JBS diode in the center area of the chip. Both MOSFET and JBS diode…”
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On Developing One-Chip Integration of 1.2 kV SiC MOSFET and JBS Diode (JBSFET)
Published in IEEE transactions on industrial electronics (1982) (01-10-2017)“…This paper presents the design, fabrication, and characterization of the SiC JBSFET (junction barrier Schottky (JBS) diode integrated MOSFET). The fabrication…”
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3
Green Cloud Computing: Balancing Energy in Processing, Storage, and Transport
Published in Proceedings of the IEEE (01-01-2011)“…Network-based cloud computing is rapidly expanding as an alternative to conventional office-based computing. As cloud computing becomes more widespread, the…”
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Energy Consumption in Optical IP Networks
Published in Journal of lightwave technology (01-07-2009)“…As community concerns about global energy consumption grow, the power consumption of the Internet is becoming an issue of increasing importance. In this paper,…”
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5
A New Edge Termination Technique for High-Voltage Devices in 4H-SiC-Multiple-Floating-Zone Junction Termination Extension
Published in IEEE electron device letters (01-07-2011)“…A new edge termination method, referred to as multiple-floating-zone junction termination extension (MFZ-JTE), is presented for high-voltage devices in 4H-SiC…”
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6
Evolution of WDM Optical IP Networks: A Cost and Energy Perspective
Published in Journal of lightwave technology (01-02-2009)“…We review technologies and architectures for WDM optical IP networks from the viewpoint of capital expenditure and network energy consumption. We show how…”
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7
Implant Straggle Impact on 1.2 kV SiC Power MOSFET Static and Dynamic Parameters
Published in IEEE journal of the Electron Devices Society (2022)“…Significant impact of the ion-implant straggle of the P + shielding region on the static and dynamic characteristics of 1.2 kV 4H-SiC power MOSFETs is…”
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2.3 kV 4H-SiC Planar-Gate Accumulation Channel Power JBSFETs: Analysis of Experimental Data
Published in IEEE journal of the Electron Devices Society (2021)“…Experimental results obtained for 2.3 kV SiC planar-gate power JBSFETs with different cell topologies are analyzed in this article using analytical models and…”
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9
Analytical Modeling of IGBTs: Challenges and Solutions
Published in IEEE transactions on electron devices (01-02-2013)“…With the availability of advanced computing capability, it is fashionable to analyze and design insulated-gate bipolar transistors (IGBTs) using sophisticated…”
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10
Assessment of Linear, Hexagonal, and Octagonal Cell Topologies for 650 V 4H-SiC Inversion-Channel Planar-Gate Power JBSFETs Fabricated With 27 nm Gate Oxide Thickness
Published in IEEE journal of the Electron Devices Society (2021)“…A 27 nm gate oxide thickness has been successfully used for manufacturing high performance 650V 4H-SiC planar-gate, inversion-channel power JBSFETs in a 6-inch…”
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A Near Ideal Edge Termination Technique for 4500V 4H-SiC Devices: The Hybrid Junction Termination Extension
Published in IEEE electron device letters (01-12-2016)“…This letter presents a new edge termination technique named a hybrid junction termination extension (Hybrid-JTE), which combines ring-assisted JTE and multiple…”
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12
A Novel 1.2 kV 4H-SiC Buffered-Gate (BG) MOSFET: Analysis and Experimental Results
Published in IEEE electron device letters (01-02-2018)“…A novel 1.2-kV-rated 4H-SiC buffered-gate MOSFET (BG-MOSFET) structure is proposed and experimentally demonstrated to have superior high frequency…”
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13
A New Method for Blocking Probability Evaluation in OBS/OPS Networks With Deflection Routing
Published in Journal of lightwave technology (01-12-2009)“…In this paper, we present a new method for the estimation of blocking probabilities in bufferless optical burst or packet switched networks. In such networks,…”
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14
Comparison of Four Cell Topologies for 1.2-kV Accumulation- and Inversion-Channel 4H-SiC MOSFETs: Analysis and Experimental Results
Published in IEEE transactions on electron devices (01-05-2019)“…The electrical characteristics of 1.2-kV-rated 4H-SiC accumulation (Acc) and inversion (Inv) channel MOSFETs with linear, square, hexagonal, and octagonal cell…”
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15
Comprehensive Physics of Third Quadrant Characteristics for Accumulation- and Inversion-Channel 1.2-kV 4H-SiC MOSFETs
Published in IEEE transactions on electron devices (01-09-2019)“…Detailed physics of the third quadrant electrical characteristics of 1.2-kV rated 4H-SiC accumulation (Acc) and inversion (Inv) channel MOSFETs, based on…”
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The 1.2-kV 4H-SiC OCTFET: A New Cell Topology With Improved High-Frequency Figures-of-Merit
Published in IEEE electron device letters (01-02-2019)“…A 1.2 kV rated 4H-SiC OCTFET device with octagonal-cell topology is proposed and experimentally demonstrated for the first time. The device was first optimized…”
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Comparison of 2.3-kV 4H-SiC Accumulation-Channel Planar Power MOSFETs Fabricated With Linear, Square, Hexagonal, and Octagonal Cell Topologies
Published in IEEE transactions on electron devices (01-09-2020)“…The performance of four cell topologies is compared for 2.3-kV 4H-SiC power MOSFETs fabricated in a commercial 6-in foundry. The devices were simultaneously…”
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650-V 4H-SiC Planar Inversion-Channel Power JBSFETs With 55-nm Gate Oxide: Relative Performance of Three Cell Types
Published in IEEE transactions on electron devices (01-05-2021)“…Planar 650-V 4H-silicon carbide (SiC), inversion-channel, 55-nm gate oxide junction barrier Schottky field effect transistors (JBSFETs) with three types of…”
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Analysis and Experimental Quantification of 1.2-kV 4H-SiC Split-Gate Octagonal MOSFET
Published in IEEE electron device letters (01-07-2019)“…A 1.2-kV rated 4H-SiC split-gate octagonal cell MOSFET (SG-OCTFET) is proposed and successfully fabricated in a 6-in foundry for the first time. The measured…”
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Service Failure and Recovery in B2B Markets – A Morphological Analysis
Published in Journal of business research (01-07-2021)“…•Morphology of Service Failure and Recovery in B2B markets is analyzed.•Eight dimensions and 62 variants are identified.•418 research gaps identified using a…”
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