Search Results - "Bahi, M.A."
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Sequential environmental stresses tests qualification for automotive components
Published in Microelectronics and reliability (2007)Get full text
Journal Article -
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A new methodology for the identification of ball bond degradation during high-temperature aging tests on devices in standard plastic packages
Published in Microelectronics and reliability (01-09-2009)“…We describe a new methodology for the “in situ” identification of wire-bond degradation at early stages during high-temperature aging tests on devices with…”
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Journal Article Conference Proceeding -
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Sequential environmental stresses tests qualification for automotive components
Published in Microelectronics and reliability (01-09-2007)“…The purpose is to create a new qualification methodology for plastic encapsulated electronic components used in an automotive environment at high temperature…”
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Journal Article Conference Proceeding -
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Degradation Mechanisms of Au-Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification
Published in IEEE transactions on device and materials reliability (01-09-2008)“…Several package families used in automotive environment were aged at different high temperatures. The purpose was to better characterize the predominant…”
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Magazine Article -
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Package delamination as indicator of ball bond lift: New diagnostic methodology
Published in EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01-04-2009)“…The components used in the automotive environment are subjected during their lives to various environmental combined stresses. The predominant failure…”
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Conference Proceeding -
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Bond Reliability Improvement at High Temperature by Pd Addition on Au Bonding Wires
Published in 2008 10th Electronics Packaging Technology Conference (01-01-2008)“…To extend the qualification domain to the biggest package size in the automotive environment at high temperature, it is necessary to improve the Au-Al bond…”
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Conference Proceeding -
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