Search Results - "Baboly, M. G"

Reduction and Increase in Thermal Conductivity of Si Irradiated with Ga+ via Focused Ion Beam by Alaie, S, Baboly, M. G, Jiang, Y.-B, Rempe, S, Anjum, D. H, Chaieb, S, Donovan, B. F, Giri, A, Szwejkowski, C. J, Gaskins, J. T, Elahi, M. M. M, Goettler, D. F, Braun, J, Hopkins, P. E, Leseman, Z. C

“…Focused ion beam (FIB) technology has become a valuable tool for the microelectronics industry and for the fabrication and preparation of samples at the…”
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1D thermal characterization of micro/nano-cantilevers for Suspended ThermoReflectance measurements by Sarkar, Dipta, Brady, Jeffrey, Baboly, M. G., Xu, Leidong, Singh, Gurpreet, Leseman, Z. C.

“…Creating micro/nanoscale systems with one dimension substantially larger than the others is relatively straightforward, and convenient for studying thermal…”
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