Search Results - "BERJOAN, R."

Recombination coefficient of atomic oxygen on ceramic materials under earth re-entry conditions by optical emission spectroscopy by Balat-Pichelin, M, Badie, J.M, Berjoan, R, Boubert, P

“…To develop heat shields for space vehicles, materials must be characterized in simulation conditions close to those in space environments. The most important…”
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XPS analyses of lanthanides phosphates by Glorieux, B., Berjoan, R., Matecki, M., Kammouni, A., Perarnau, D.

“…XPS measurements were performed on lanthanide orthophosphates LnPO 4 (Ln: La, Ce, Nd, Gd), and correlated with XRD and some EDS analyses. Single lanthanide…”
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Selective effect of ion/surface interaction in low frequency PACVD of SIC:H films: Part B. Microstructural study by Soum Glaude, A., Thomas, L., Tomasella, E., Badie, J.M., Berjoan, R.

“…A capacitively coupled low frequency PACVD device ( ν = 50 kHz, DC bias: | V dc| = 0 to 400 V) is used to deposit hard amorphous silicon carbide films…”
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Characterisation of hydrophilic ceramic membranes modified by fluoroalkylsilanes into hydrophobic membranes by Picard, C., Larbot, A., Tronel-Peyroz, E., Berjoan, R.

“…In order to avoid high hydrophilic behaviour of ceramic membranes prepared with metal oxides, different zirconia membranes were grafted by different…”
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Solar preparation of SiOx (x 1) nanopowders from silicon vaporisation on a ZrO2 pellet. XPS and photoluminescence characterisation by TEIXEIRA, F, BERJOAN, R, PERAUDEAU, G, PERARNAU, D

“…SiOx nanoparticles were prepared by vaporisation and condensation of melted silicon droplets put on zirconia pellets in a solar reactor at the focus of a 2 kW…”
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Validation of the mechanism of nitrogen/oxygen substitution in Li–Na–Pb–P–O–N oxynitride phosphate glasses by Muñoz, F., Pascual, L., Durán, A., Berjoan, R., Marchand, R.

“…As evidenced by O1s X-ray photoelectron spectroscopy, there are three kinds of oxygen atoms in Li0.25Na0.25Pb0.25PO3−3x/2Nx oxynitride phosphate glasses…”
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An XPS and AES study of the free corrosion of Cu-, Ni- and Zn-based alloys in synthetic sweat by Colin, S, Beche, E, Berjoan, R, Jolibois, H, Chambaudet, A

“…This paper deals with the investigations into the behaviour during free corrosion of Cu/Zn/Ni, Cu/Ni/Zn and Ni/Cu alloys in a synthetic sweat medium by means…”
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Sb-doped SnO2 transparent conducting oxide from the sol-gel dip-coating technique by TERRIER, C, CHATELON, J. P, BERJOAN, R, ROGER, J. A

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Pore structure modification of pitch-based activated carbon by NaOCl and air oxidation/pyrolysis cycles by Cagnon, B., Py, X., Guillot, A., Joly, J.P., Berjoan, R.

“…Two complementary wearing off cycling methods based on an initial wet oxidation in a sodium hypochlorite solution or an initial dry oxidation under air, both…”
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Variations in the physico-chemical properties of near-stoichiometric silica deposited from SiH4-N2O and SiH4-N2O-He radiofrequency discharges by CHAYANI, M, CAQUINEAU, H, DESPAX, B, BANDET, J, BERJOAN, R

“…Silicon oxide thin films were deposited at low temperatures by Plasma-Enhanced Chemical Vapour Deposition (PECVD) from silane-nitrousoxide (SiH4-N2O) and…”
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Surface investigation of plasma HMDSO membranes post-treated by CF4/Ar plasma by FINOT, E, ROUALDES, S, KIRCHNER, M, ROUESSAC, V, BERJOAN, R, DURAND, J, GOUDONNET, J.-P, COT, L

“…Fluorination treatment has been performed on polysiloxane membranes using a plasma glow discharge of a gases mixture CF4 and argon (plasma enhanced chemical…”
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Selective effect of ion/surface interaction in low frequency PACVD of SiC:H films: Part A. Gas phase considerations by Soum-Glaude, A., Thomas, L., Tomasella, E., Badie, J.M., Berjoan, R.

“…Hard silicon carbide based films (a-SiC:H) are obtained in a capacitively coupled low frequency PACVD device from the decomposition of tetramethylsilane (TMS)…”
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Physico-chemical behavior of carbon materials under high temperature and ion irradiation by Paulmier, T, Balat-Pichelin, M, Le Quéau, D, Berjoan, R, Robert, J.F

“…Carbon/carbon (C/C) composites have been chosen for the conception of the thermal shield of the “Solar Probe” space mission. To understand their behavior under…”
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Controlled Nucleation and Growth of Thin Hydroxyapatite Layers on Titanium Implants by Using Induction Heating Technique by Gómez Morales, J, Rodríguez Clemente, R, Armas, B, Combescure, C, Berjoan, R, Cubo, J, Martínez, E, García Carmona, J, Garelik, S, Murtra, J, Muraviev, D. N

“…This paper reports the results obtained by the development of a new wet method of hydroxyapatite (HA) thin layer deposition. The method is based on the…”
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Friction and wear mechanisms of thermally sprayed ceramic and cermet coatings by Fervel, V., Normand, B., Liao, H., Coddet, C., Bêche, E., Berjoan, R.

“…The tribological behavior of Al 2O 3/TiO 2 and WC/Co plasma-sprayed coatings was studied under dry sliding conditions. X-ray photoelectron spectroscopic…”
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Oxidation of sintered silicon carbide under microwave-induced CO2 plasma at high temperature : active-passive transition by BALAT, M, BERJOAN, R

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Surface investigation of plasma HMDSO membranes post-treated by CF 4/Ar plasma by Finot, E, Roualdes, S, Kirchner, M, Rouessac, V, Berjoan, R, Durand, J, Goudonnet, J.-P, Cot, L

“…Fluorination treatment has been performed on polysiloxane membranes using a plasma glow discharge of a gases mixture CF 4 and argon (plasma enhanced chemical…”
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Study of the chemical and structural organization of SIPOS films at the nanometer scale by TEM–EELS and XPS by Schamm, S, Berjoan, R, Barathieu, P

“…Two films of semi-insulating polycrystalline silicon (SIPOS) have been prepared by low pressure chemical vapor deposition (LPCVD). Their physico-chemical…”
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Influence of dopant concentration and type of substrate on the local organization of low-pressure chemical vapour deposition in situ boron doped silicon films from silane and boron trichloride by Caussat, B., Scheid, E., de Mauduit, B., Berjoan, R.

“…The deposition of in situ boron doped silicon films from boron trichloride BCl 3 and silane SiH 4 in a conventional low-pressure chemical vapour deposition…”
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Mass density determination of thin organosilicon films by X-ray reflectometry by van der Lee, A., Roualdes, S., Berjoan, R., Durand, J.

“…The mass density of thin organosilicon films deposited by chemical vapour deposition on silicon (0 0 1) surfaces has been determined by X-ray reflectometry…”
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