Search Results - "BELLUR, K. R"

Low parasitic resistance contacts for scaled ULSI devices by OSBURN, C. M, BELLUR, K. R

“…Unless contact resistivity is reduced, the contact resistance ultimately becomes higher than the channel resistance and becomes useless in modern day devices…”
Get full text

Phase evolution and annealing effects on the electrical properties of Pb(Zr0.53Ti0.47)O3 thin films with RuO2 electrodes by AL-SHAREEF, H. N, BELLUR, K. R, AUCIELLO, O, KINGON, A. I

Get full text

Influence of platinum interlayers on the electrical properties of RuO2/Pb(Zr0.53Ti0.47)O3/RuO2 capacitor heterostructures by Al-Shareef, H. N., Bellur, K. R., Kingon, A. I., Auciello, O.

“…Lead zirconate titanate, Pb(ZrxTi1−x)O3 or PZT, thin films grown on RuO2 electrodes by the sol-gel process have excellent resistance to polarization fatigue,…”
Get full text

Contribution of electrodes and microstructures to the electrical properties of Pb(Zr 0.53 Ti 0.47 )O 3 thin film capacitors by Al-Shareef, H.N., Kingon, A.I., Chen, X., Bellur, K.R., Auciello, O.

“…Pb(Zr 0.53 Ti 0.47 )O 3 (PZT) thin film capacitors have been fabricated with four electrode combinations: Pt /PZT/ Pt /SiO 2 Si, RuO 2 /PZT/ Pt /SiO 2 /Si, RuO…”
Get full text

Electrical characterization of sol-gel derived PZT thin films by Bellur, K.R., Al-Shareef, H.N., Rou, S.H., Gifford, K.D., Auciello, O., Kingon, A.I.

“…Thin films of lead zirconate titanate (PZT) were deposited on a variety of substrates using the sol-gel process. These included Pt/Ti/SiO/sub 2//Si, RuO/sub…”
Get full text

Phase evolution and annealing effects on the electrical properties of Pb(Zr sub(0.53)Ti sub(0.47))O sub(3) thin films with RuO sub(2) electrodes by Al-Shareef, H N, Bellur, K R, Auciello, O, Kingon, A I

“…The electrical properties and crystallization of Pb(Zr sub(0.53)Ti sub(0.47))O sub(3) (PZT) thin films grown on RuO sub(2) electrodes by the sol-gel process…”
Get full text