Search Results - "BECKHOFF, B"

In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy by Nolot, E., Cadot, S., Martin, F., Hönicke, P., Zech, C., Beckhoff, B.

“…Industry-scalable fabrication methods of sulfur-based transition metal dichalcogenides are being developed, which puts strong requirements on the…”
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Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination? by Dietrich, P. M., Streeck, C., Glamsch, S., Ehlert, C., Lippitz, A., Nutsch, A., Kulak, N., Beckhoff, B., Unger, W. E. S.

“…Organosilanes are used routinely to functionalize various support materials for further modifications. Nevertheless, reliable quantitative information about…”
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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils by Hönicke, P., Kolbe, M., Krumrey, M., Unterumsberger, R., Beckhoff, B.

“…In this work, the K-shell fluorescence yield for oxygen ωO,K−shell is determined experimentally, employing the radiometrically calibrated X-ray fluorescence…”
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Approaches to calculate the dielectric function of ZnO around the band gap by Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M., Petrik, P.

“…Being one of the most sensitive methods for optical thin film metrology ellipsometry is widely used for the characterization of zinc oxide (ZnO), a key…”
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Ion beam analysis of Cu(In,Ga)Se2 thin film solar cells by Karydas, A.G., Streeck, C., Radovic, I. Bogdanovic, Kaufmann, C., Rissom, T., Beckhoff, B., Jaksic, M., Barradas, N.P.

“…•Elemental depth profiles for various CIGS thin films were quantitatively determined.•Pure absorbers, complete cell and bilayer solar cells were prepared and…”
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A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin by Ménesguen, Y., Lépy, M.‐C., Sampaio, J. M., Marques, J. P., Parente, F., Guerra, M., Indelicato, P., Santos, J. P., Hönicke, P., Beckhoff, B.

“…The knowledge of atomic fundamental parameters, such as the mass attenuation coefficients or fluorescence yields with low uncertainties, is of decisive…”
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CASTOR, a new instrument for combined XRR‐GIXRF analysis at SOLEIL by Ménesguen, Y., Boyer, B., Rotella, H., Lubeck, J., Weser, J., Beckhoff, B., Grötzsch, D., Kanngießer, B., Novikova, A., Nolot, E., Lépy, M.‐C.

“…A new instrument called CASTOR is operated at the SOLEIL synchrotron facility and is dedicated to the characterization of thin films with thicknesses in the…”
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Characterization of iron-gall inks in historical manuscripts and music compositions using x-ray fluorescence spectrometry by Hahn, O., Malzer, W., Kanngiesser, B., Beckhoff, B.

“…The qualitative and quantitative investigation of historical iron‐gall inks using micro‐XRF spectrometry is a suitable method for analyzing composition…”
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Characterization of ZnO structures by optical and X-ray methods by Petrik, P., Pollakowski, B., Zakel, S., Gumprecht, T., Beckhoff, B., Lemberger, M., Labadi, Z., Baji, Z., Jank, M., Nutsch, A.

“…► Comparison of optical and X-ray results on GaInZnO samples with Ga<1at%. ► Elemental composition determined by reference-free X-ray fluorescence. ►…”
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Association between one’s own consumption and harm from others’ drinking: Does education play a role? by Beckhoff, Gabriele B., Stock, Christiane, Bloomfield, Kim

“…Introduction: We examined (a) whether risky drinking behaviour is related to experienced harm from others’ drinking (EHFOD) and (b) whether any found…”
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In-depth elemental characterization of Cu(In,Ga)Se2 thin film solar cells by means of RBS and PIXE techniques by Karydas, A.G., Bogdanovic Radovic, I., Streeck, C., Kaufmann, C., Caballero, R., Rissom, T., Kanngießer, B., Beckhoff, B., Jaksic, M., Barradas, N.P.

“…Thin films based on Cu(In,Ga)Se2 are used as absorber cells in photovoltaic devices. In and Ga graded depth profiles are designed to optimize the solar cell…”
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Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis by Streeck, C., Beckhoff, B., Reinhardt, F., Kolbe, M., Kanngießer, B., Kaufmann, C.A., Schock, H.W.

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Atomic layer deposition of Al2O3 on S-passivated Ge by SIONCKE, S, CEUPPENS, J, LIN, D, NYNS, L, DELABIE, A, STRUYF, H, DE GENDT, S, MÜLLER, M, BECKHOFF, B, CAYMAX, M

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Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds by Reinhardt, F, Beckhoff, B, Eba, H, Kanngiesser, B, Kolbe, M, Mizusawa, M, Müller, M, Pollakowski, B, Sakurai, K, Ulm, G

“…For the chemical speciation of binary compounds of tri- and tetravalent titanium, high-resolution X-ray absorption and emission spectra were recorded in…”
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Chemical interactions in the layered system BCxNy/Ni(Cu)/Si, produced by CVD at high temperature by Hoffmann, P. S., Kosinova, M. I., Flege, S., Baake, O., Pollakowski, B., Trunova, V. A., Klein, A., Beckhoff, B., Kuznetsov, F. A., Ensinger, W.

“…Layered samples Si(100)/C/Ni/BC x N y and Si(100)/C/Cu/BC x N y were produced by physical vapor deposition of a metal (Ni, Cu, resp.) and low-pressure chemical…”
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GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen by Pagels, M., Reinhardt, F., Pollakowski, B., Roczen, M., Becker, C., Lips, K., Rech, B., Kanngießer, B., Beckhoff, B.

“…GIXRF–NEXAFS is a combination of X-ray spectroscopy methods which allows for a non-destructive, depth-dependant chemical speciation of layer systems in the…”
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Chemical interactions in the layered system BC x N y /Ni(Cu)/Si, produced by CVD at high temperature by Hoffmann, P. S., Kosinova, M. I., Flege, S., Baake, O., Pollakowski, B., Trunova, V. A., Klein, A., Beckhoff, B., Kuznetsov, F. A., Ensinger, W.

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Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic by Beckhoff, B., Kolbe, M., Hahn, O., Karydas, A. G., Zarkadas, Ch, Sokaras, D., Mantler, M.

“…The investigation of an ancient Chinese ceramic served to further develop and validate fundamental parameter‐based quantitation procedures in reference‐free…”
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Nitrogen and sulfur compounds in coastal Antarctic fine aerosol particles—an insight using non-destructive X-ray microanalytical methods by Osán, J., Török, S., Beckhoff, B., Ulm, G., Hwang, H., Ro, C.-U., Abete, C., Fuoco, R.

“…The capabilities of X-ray microanalytical methods, such as a near edge X-ray absorption fine structure (NEXAFS) investigation in conjunction with total…”
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Chemical bonding in carbonitride nanolayers by Hoffmann, P., Baake, O., Beckhoff, B., Ensinger, W., Fainer, N., Klein, A., Kosinova, M., Pollakowski, B., Trunova, V., Ulm, G., Weser, J.

“…First results are presented for the identification of chemical bonds and structures (speciation) in boron and silicon carbonitrides, produced as layers of some…”
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