Search Results - "Assafrao, A C"

Submicron hollow spot generation by solid immersion lens and structured illumination by Kim, M-S, Assafrao, A C, Scharf, T, Wachters, A J H, Pereira, S F, Urbach, H P, Brun, M, Olivier, S, Nicoletti, S, Herzig, H P

“…We report on the experimental and numerical demonstration of immersed submicron-size hollow focused spots, generated by structuring the polarization state of…”
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Coherent Fourier scatterometry for detection of nanometer-sized particles on a planar substrate surface by Roy, S, Assafrão, A C, Pereira, S F, Urbach, H P

“…Inspection tools for nano-particle contamination on a planar substrate surface is a critical problem in micro-electronics. The present solutions are either…”
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Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy by Schmidt, S, Klein, A E, Paul, T, Gross, H, Diziain, S, Steinert, M, Assafrao, A C, Pertsch, T, Urbach, H P, Rockstuhl, C

“…Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of…”
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Application of micro solid immersion lens as probe for near-field scanning microscopy by Assafrao, A. C., Kumar, N., Wachters, A. J. H., Pereira, S. F., Urbach, H. P., Brun, M., Olivier, Segolene

“…We present an experimental and theoretical study of the immersing properties of a micron-sized solid immersion lens (μ-SIL) and evaluate its capabilities of…”
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Direct measurement of the near-field super resolved focused spot in InSb by Assafrao, A C, Wachters, A J H, Verheijen, M, Nugrowati, A M, Pereira, S F, Urbach, H P, Armand, Marie-Francoise, Olivier, Segolene

“…Under appropriate laser exposure, a thin film of InSb exhibits a sub-wavelength thermally modified area that can be used to focus light beyond the diffraction…”
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Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy by Schmidt, S, Klein, A. E, Paul, T, Gross, H, Diziain, S, Steinert, M, Assafrao, A. C, Pertsch, T, Urbach, H. P, Rockstuhl, C

“…Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of…”
Get full text