Search Results - "Arz, Uwe"

Crosstalk Corrections for Coplanar-Waveguide Scattering-Parameter Calibrations by Williams, Dylan F., Schmuckle, Franz-Josef, Doerner, Ralf, Gia Ngoc Phung, Arz, Uwe, Heinrich, Wolfgang

“…We study crosstalk and crosstalk corrections in coplanar-waveguide vector-network-analyzer calibrations. We show that while crosstalk corrections can improve…”
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Precise Modeling of Coplanar Device Measurements under Realistic Conditions up to G Band by Phung, Gia Ngoc, Arz, Uwe, Heinrich, Wolfgang

“…Coplanar devices are being used in many new applications, from next generation (6G) wireless communication systems to autonomous driving and radar sensors…”
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110 GHz on-wafer measurement comparison on alumina substrate by Probst, Thorsten, Doerner, Ralf, Ohlrogge, Matthias, Lozar, Roger, Arz, Uwe

“…This paper reports on initial results of a three-party on-wafer measurement comparison carried out on a custom-made alumina calibration substrate in the…”
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Influence of Microwave Probes on Calibrated On-Wafer Measurements by Phung, Gia Ngoc, Schmuckle, Franz Josef, Doerner, Ralf, Kahne, Bernhard, Fritzsch, Thomas, Arz, Uwe, Heinrich, Wolfgang

“…On-wafer probing with ground-signal-ground (GSG) probes contributes a variety of side effects, which are related to the measured line type, the carrier…”
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Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides by Phung, Gia Ngoc, Arz, Uwe

“…On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been…”
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Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz by Arz, Uwe, Kuhlmann, Karsten, Dziomba, Thorsten, Hechtfischer, Gerd, Phung, Gia Ngoc, Schmuckle, Franz Josef, Heinrich, Wolfgang

“…In this paper, we present a comprehensive uncertainty budget for on-wafer S-parameter measurements of devices on a custom-built fused silica wafer, including…”
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Guidelines for the Design of Thin Film Microstrip Lines for Signal Integrity Analysis by Lahbacha, Khitem, Phung, Gia Ngoc, Pham, Thi Dao, Arz, Uwe, Capua, Giulia Di, Maffucci, Antonio, Miele, Gianfranco, Allal, Djamel

“…This paper investigates the performance of Thin-Film Microstrip Lines (TFMSLs), characterized by low-resistivity substrates, and proposed as interconnects in…”
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Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods by Shang, Xiaobang, Naftaly, Mira, Skinner, James, Ausden, Liam, Gregory, Andrew, Ridler, Nick M., Arz, Uwe, Ngoc Phung, Gia, Ulm, David, Kleine-Ostmann, Thomas, Allal, Djamel, Wojciechowski, Marcin, Kazemipour, Alireza, Gaumann, Gregory, Hudlicka, Martin

“…This article reports on an extensive interlaboratory comparison of measurements of material properties between 2 GHz and 1 THz using both vector network…”
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A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies by Lozar, Roger, Ohlrogge, Matthias, Weber, Rainer, Ridler, Nick M., Shang, Xiaobang, Probst, Thorsten, Arz, Uwe

“…In this paper, we present a comparative study of S-parameter measurements of electronic components on planar substrates performed with a waveguide module and…”
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Uncertainties in complex permittivity extraction from coplanar waveguide scattering-parameter data by Arz, Uwe, Williams, Dylan F.

“…We analyze the uncertainties of a complex permittivity extraction procedure based on uncorrected scattering-parameter measurements of coplanar waveguides of…”
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Comparison between time- and frequency-domain high-frequency device characterizations by Bieler, Mark, Arz, Uwe

“…We characterize a high-frequency device consisting of coplanar and coaxial elements using time- and frequency domain methods. As frequency-domain technique we…”
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High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness by Gold, Gerald, Lomakin, Konstantin, Helmreich, Klaus, Arz, Uwe

“…An existing analytical transmission line model to describe propagation properties of coplanar waveguides including dispersion and radiation effects was…”
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Measurement and Analysis of On-Wafer Test Structures for Signal Integrity Assessment at Chip Level by Pham, Thi Dao, Ngoc Phung, Gia, Lahbacha, Khitem, Maffucci, Antonio, Miele, Gianfranco, Arz, Uwe, Allal, Djamel

“…This paper presents the characterization and analysis of thin film microstrip line coupled test structures designed for evaluating Signal Integrity (SI) and…”
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Uncertainties in split-cylinder resonator measurements by Kuhlmann, K., Arz, U.

“…In this paper we present uncertainty budgets for measurements with a split-cylinder resonator for dielectric material characterization. A Monte-Carlo analysis…”
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Improving the Performance of 110 GHz Membrane-Based Interconnects on Silicon: Modeling, Measurements, and Uncertainty Analysis by Arz, Uwe, Rohland, Martina, Buttgenbach, Stephanus

“…In this paper, we describe the development of broadband low-loss interconnects built-in membrane technology on different silicon substrates. We discuss the…”
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An optimal vector-network-analyzer calibration algorithm by Williams, D.F., Wang, J.C.M., Arz, U.

“…We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The algorithm features a robust, yet…”
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Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity by Janezic, M.D., Arz, U., Begley, S., Bartley, P.

“…We use the split-cylinder cavity's TE 111 resonant mode, in addition to the higher-order TE 0np modes, to extend the frequency range over which one can…”
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On the Influence of Thru- and Line-Length-Related Effects in CPW- Based Multiline TRL Calibrations by Phung, Gia Ngoc, Arz, Uwe

“…The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of the multiline Thru-Reflect Line (TRL) calibration…”
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Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements by Phung, Gia Ngoc, Arz, Uwe

“…While a lot of investigations have been presented recently explaining the parasitic effects in on-wafer measurements caused by probes, neighborhood and…”
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Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides by Phung, Gia Ngoc, Arz, Uwe

“…Recently, parasitic effects in on-wafer measurements have been investigated thoroughly and can be classified as stemming from probe effects, multimode…”
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