Search Results - "Arthur, S. D."

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  1. 1

    High-power and reliable operation of vertical light-emitting diodes on bulk GaN by Cao, X. A., Arthur, S. D.

    Published in Applied physics letters (01-11-2004)
    “…In Ga N ∕ Ga N light-emitting diodes (LEDs) with lateral and vertical geometries have been fabricated on free-standing GaN substrates. Current spreading was…”
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    Journal Article
  2. 2

    Microstructural origin of leakage current in GaN/InGaN light-emitting diodes by Cao, X.A, Teetsov, J.A, Shahedipour-Sandvik, F, Arthur, S.D

    Published in Journal of crystal growth (15-03-2004)
    “…A combination of atomic force microscopy (AFM), conductive AFM (C-AFM) and scanning Kelvin probe microscopy (SKPM) was used to investigate the correlation…”
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    Journal Article
  3. 3

    Blue and near-ultraviolet light-emitting diodes on free-standing GaN substrates by Cao, X. A., LeBoeuf, S. F., D’Evelyn, M. P., Arthur, S. D., Kretchmer, J., Yan, C. H., Yang, Z. H.

    Published in Applied physics letters (24-05-2004)
    “…Blue and near-ultraviolet (UV) InGaN/GaN multiple-quantum-well light-emitting diodes (LEDs) with peak emission at 465 nm and 405 nm, respectively, were grown…”
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    Journal Article
  4. 4

    Growth and characterization of GaN PiN rectifiers on free-standing GaN by Cao, X. A., Lu, H., LeBoeuf, S. F., Cowen, C., Arthur, S. D., Wang, W.

    Published in Applied physics letters (01-08-2005)
    “…GaN PiN rectifiers with high structural quality were grown on free-standing GaN substrates using metalorganic chemical vapor deposition. The lattice mismatch…”
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    Journal Article
  5. 5

    Outcome implications for the timing of bilateral total knee arthroplasties by Ritter, M, Mamlin, L A, Melfi, C A, Katz, B P, Freund, D A, Arthur, D S

    Published in Clinical orthopaedics and related research (01-12-1997)
    “…Health Care Financing Administration data from 1985 to 1990 revealed 339,152 total knee arthroplasties of which 62,730 (18.6%) were bilateral procedures…”
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    Journal Article
  6. 6

    Stacking-fault formation and propagation in 4H-SiC PiN diodes by Stahlbush, R. E., Fatemi, M., Fedison, J. B., Arthur, S. D., Rowland, L. B., Wang, S.

    Published in Journal of electronic materials (01-05-2002)
    “…Stacking-fault growth in SiC PiN diodes has been examined using light-emission imaging and stressing at 80 A/cm super(2) and 160 A/cm super(2). Dark areas in…”
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    Journal Article
  7. 7

    Structure of stacking faults formed during the forward bias of 4H-SiC p-i-n diodes by Twigg, M. E., Stahlbush, R. E., Fatemi, M., Arthur, S. D., Fedison, J. B., Tucker, J. B., Wang, S.

    Published in Applied physics letters (14-04-2003)
    “…Using site-specific plan-view transmission electron microscopy (TEM) and light emission imaging, we have identified stacking faults formed during forward…”
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    Journal Article
  8. 8

    Homoepitaxial growth and electrical characterization of GaN-based Schottky and light-emitting diodes by Cao, X.A., Lu, H., Kaminsky, E.B., Arthur, S.D., Grandusky, J.R., Shahedipour-Sandvik, F.

    Published in Journal of crystal growth (15-03-2007)
    “…Homoepitaxial growth of GaN epilayers on free-standing hydride vapor phase epitaxy (HVPE) GaN substrates offered a better control over surface morphology,…”
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    Journal Article
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  10. 10

    Bias-stress induced threshold voltage and drain current instability in 4H–SiC DMOSFETs by Okayama, T., Arthur, S.D., Garrett, J.L., Rao, M.V.

    Published in Solid-state electronics (2008)
    “…In this work, the instability of n-channel 4H–SiC double-implanted metal–oxide–semiconductor field-effect-transistors (DMOSFETs) was studied, in terms of…”
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    Journal Article
  11. 11

    Influence of GaN material characteristics on device performance for blue and ultraviolet light-emitting diodes by MERFELD, D. W, CAO, X. A, LEBOEUF, S. F, ARTHUR, S. D, KRETCHMER, J. W, D, M. P, EVELYN

    Published in Journal of electronic materials (01-11-2004)
    “…An analysis of blue and near-ultraviolet (UV) light-emitting diodes (LEDs) and material structures explores the dependence of device performance on material…”
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    Journal Article
  12. 12

    Partial dislocations and stacking faults in 4H-SiC PiN diodes by TWIGG, M. E, STAHLBUSH, R. E, FATEMI, M, ARTHUR, S. D, FEDISON, J. B, TUCKER, J. B, WANG, S

    Published in Journal of electronic materials (01-05-2004)
    “…Using plan-view transmission electron microscopy (TEM), we have identified stacking faults (SFs) in 4H-SiC PiN diodes subjected to both light and heavy…”
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    Conference Proceeding Journal Article
  13. 13

    Homoepitaxially grown GaN-based light-emitting diodes with peak emission at 405 nm by Cao, X.A., Yan, C.H., D’Evelyn, M.P., LeBoeuf, S.F., Kretchmer, J.W., Klinger, R., Arthur, S.D., Merfeld, D.W.

    Published in Journal of crystal growth (01-09-2004)
    “…Near-ultraviolet InGaN/GaN multiple-quantum-well light-emitting diodes (LEDs) grown homoepitaxially on a free standing GaN substrate exhibited improved…”
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    Journal Article
  14. 14

    Comparison of recovery from anaesthesia induced in children with either propofol or thiopentone by Runcie, C J, Mackenzie, S J, Arthur, D S, Morton, N S

    Published in British journal of anaesthesia : BJA (01-02-1993)
    “…We studied 102 children undergoing day-case surgery, allocated randomly to receive either thiopentone 5 mg kg-1 or propofol 3 mg kg-1 i.v. at induction of…”
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    Journal Article
  15. 15

    Cathodoluminescence mapping and selective etching of defects in bulk GaN by Lu, Hai, Cao, X.A., LeBoeuf, S.F., Hong, H.C., Kaminsky, E.B., Arthur, S.D.

    Published in Journal of crystal growth (15-05-2006)
    “…Cathodoluminescence (CL) mapping and selective-etching techniques were used to characterize defects in free-standing bulk GaN substrates prepared by hydride…”
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    Journal Article
  16. 16

    Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses by Cao, X.A., Sandvik, P.M., LeBoeuf, S.F., Arthur, S.D.

    Published in Microelectronics and reliability (01-12-2003)
    “…Electrical and optical degradations of GaN/InGaN single-quantum-well light-emitting diodes (LEDs) under high-injection current (150 A/cm 2) and reverse-bias…”
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    Journal Article
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    Revision Rates after Knee Replacement in the United States by Heck, David A., Melfi, Catherine A., Mamlin, Lorri A., Katz, Barry P., Arthur, Daniel S., Dittus, Robert S., Freund, Deborah A.

    Published in Medical care (01-05-1998)
    “…Objectives. Each year approximately 100,000 Medicare patients undergo knee replacement surgery. Patients, referring physicians, and surgeons must consider a…”
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    Journal Article
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    13C and 2D NMR Analysis of Propylene Polymers Made with α-Diimine Late Metal Catalysts by McCord, E. F, McLain, S. J, Nelson, L. T. J, Arthur, S. D, Coughlin, E. B, Ittel, S. D, Johnson, L. K, Tempel, D, Killian, C. M, Brookhart, M

    Published in Macromolecules (30-01-2001)
    “…Late transition metal catalysts bearing α-diimine ligands allow ethylene and α-olefin homo- and copolymerizations to polyolefins with unprecedented structures…”
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    Journal Article