Proton-induced transients and charge collection measurements in a LWIR HgCdTe focal plane array

Proton-induced transients and charge collection measurements in a LWIR HgCdTe focal plane array

We compare measurements and modeling of 27 and 63 MeV proton-induced transients in a large-format HgCdTe long wavelength infrared (LWIR) focal plane assembly operating at 40 K. Charge collection measurements describe very limited diffusion of carriers to multiple pixels showing significantly reduced...

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Bibliographic Details
Published in:IEEE transactions on nuclear science Vol. 50; no. 6; pp. 1968 - 1973
Main Authors: Marshall, P.W., Hubbs, J.E., Arrington, D.C., Marshall, C.J., Reed, R.A., Gee, G., Pickel, J.C., Ramos, R.A.
Format: Journal Article
Language:English
Published: New York IEEE 01-12-2003
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
Cadmium compounds
Charge
Charge measurement
Collection
Current measurement
Diffusion
Diodes
Extraterrestrial measurements
Focal plane
Laboratories
Mathematical models
Mercury compounds
NASA
Protons
Radiation effects
Space technology
Tellurides
Wavelength measurement
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Description
Summary:We compare measurements and modeling of 27 and 63 MeV proton-induced transients in a large-format HgCdTe long wavelength infrared (LWIR) focal plane assembly operating at 40 K. Charge collection measurements describe very limited diffusion of carriers to multiple pixels showing significantly reduced particle induced cross-talk for the lateral diffusion structure.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2003.820749