Search Results - "Armstrong, Sarah E."

The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs by King, M P, Reed, R A, Weller, R A, Mendenhall, M H, Schrimpf, R D, Alles, M L, Auden, E C, Armstrong, S E, Asai, M

“…Monte-Carlo radiation transport simulations are used to quantify energy deposition from δ -rays in sensitive volumes representative of future SRAM…”
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Neurocognitive and clinical characteristics of elementary school-aged children with a history of suicidal thoughts and behaviors by Chen, Qi, Armstrong, Sarah E., Vakil, Fatima, Bridge, Jeffrey A., Keilp, John G., Sheftall, Arielle H.

“…Suicidal thoughts and behaviors (STBs) in elementary school-aged youth have increased in recent years. Understanding the risks associated with childhood STBs…”
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Clinical risk factors, emotional reactivity/regulation and suicidal ideation in elementary school-aged children by Sheftall, Arielle H., Vakil, Fatima, Armstrong, Sarah E., Rausch, Joseph R., Feng, Xin, Kerns, Kathryn A., Brent, David A., Bridge, Jeffrey A.

“…Suicidal behavior (SB) in young children is rare yet in 2019, suicide was the fifth leading cause of death in 5-12-year-old youth. Understanding the risks…”
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Single-Event-Hardened CMOS Operational Amplifier Design by Blaine, Raymond W., Atkinson, Nick M., Kauppila, Jeffrey S., Loveless, T. Daniel, Armstrong, Sarah E., Holman, W. Tim, Massengill, Lloyd W.

“…Novel RHBD techniques are described that utilize charge sharing to mitigate single-event voltage transients in a folded cascode operational amplifier. These…”
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Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests by Olson, Brian D., Ingalls, J. David, Rice, Casey H., Hedge, Casey C., Cole, Patrick L., Duncan, Adam R., Armstrong, Sarah E.

“…Commercial gallium nitride high-electron mobility transistors are tested at Texas A&M University cyclotron. Degradation of gate and drain currents is…”
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Heavy Ion Testing of Commercial GaN Transistors in the Radio Frequency Spectrum by Armstrong, Sarah E., Bole, Ken, Bradley, Holly, Johnson, Ethan, Staggs, James, Shedd, Walter, Cole, Patrick L., Rice, Casey H., Ingalls, J. David, Hedge, Casey C., Duncan, Adam R., Olson, Brian D.

“…Commercial gallium nitride (GaN) high-electron mobility transistors (HEMTs) are tested in the radio frequency (RF) spectrum at heavy ion facilities to explore…”
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RHBD Technique for Single-Event Charge Cancellation in Folded-Cascode Amplifiers by Atkinson, N. M., Blaine, R. W., Kauppila, J. S., Armstrong, S. E., Loveless, T. Daniel, Hooten, N. C., Holman, W. T., Massengill, L. W., Warner, J. H.

“…A novel RHBD technique that exploits charge sharing is implemented in the single-ended gain stage of a folded-cascode operational amplifier to mitigate…”
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Laser-Induced Current Transients in Strained-Si Diodes by Hyunwoo Park, Cummings, D.J., Arora, R., Pellish, J.A., Reed, R.A., Schrimpf, R.D., McMorrow, D., Armstrong, S.E., Roh, U., Nishida, T., Law, M.E., Thompson, S.E.

“…Laser-induced current transients are measured on uniaxially stressed silicon (Si) N+/P diodes using a high speed measurement system. Controlled external…”
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Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power by Casey, M.C., Armstrong, S.E., Arora, R., King, M.P., Ahlbin, J.R., Francis, S.A., Bhuva, B.L., McMorrow, D., Hughes, H.L., McMarr, P.J., Melinger, J.S., Massengill, L.W.

“…Total ionizing dose experiments showed an increase in operating frequency (and therefore, power consumption) in bulk CMOS ring oscillators when operated at…”
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A single-event-hardened CMOS operational amplifier design by Blaine, Raymond W., Atkinson, Nicholas M., Kauppila, Jeffrey S., Armstrong, Sarah E., Holman, W. Timothy, Massengill, Lloyd W.

“…Novel RHBD techniques are described that utilize charge sharing to mitigate voltage transients due to single event strikes in a folded cascode operational…”
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