Search Results - "Armer, John"

High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation by Mergens, Markus P.J., Russ, Christian C., Verhaege, Koen G., Armer, John, Jozwiak, Phillip C., Mohn, Russ

“…This paper presents a novel Silicon Controlled Rectifier (SCR) for power line and local I/O ESD protection. The High holding current SCRs (HHI-SCR) exhibits a…”
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Novel design of driver and ESD transistors with significantly reduced silicon area by Verhaege, Koen G, Mergens, Markus, Russ, Christian, Armer, John, Jozwiak, Phillip

“…This paper presents three novel design techniques, which combined fulfill all major requirements posed on large driver and electrostatic discharge (ESD)…”
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ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies by Mergens, M., Wybo, G., Van Camp, B., Keppens, B., De Ranter, F., Verhaege, K., Jozwiak, P., Armer, J., Russ, C.

“…This paper presents a protection strategy for ultra-sensitive I/O containing thin gate oxides, while combining two complementary ESD design approaches: (1)…”
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Chip set for MPEG-2 video encoding by Armer, John, Bard, Jean-Michel, Canfield, Barth, Charlot, Didier, Freeman, Smith, Graf, Andreas, Kessler, Rolf, Lamouroux, Gilles, Mayweather, William T, Patti, Michael, Paul, Philippe, Pirson, Alain, Rominger, Friedrich, Teichner, Detlef

“…A VLSI architecture for compression and encoding of digital video signals according to the MPEG-2 Video standard is described. The chip set is based on four…”
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High Holding Current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation by Mergens, Markus P.J., Russ, Christian C., Verhaege, Koen G., Armer, John, Jozwiak, Phillip C., Mohn, Russ

“…This paper presents a novel SCR for power line and local I/O ESD protection. The HHI-SCR exhibits a dual ESD clamp characteristic: low-current high-voltage…”
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The effect of technological change on human relations in a garment factory by Armer, John E

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Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies by Mergens, M., Armer, J., Jozwiak, P., Keppens, B., De Ranter, F., Verhaege, K., Kumar, R.

“…This paper presents a novel active-source-pump (ASP) circuit technique to significantly lower the ESD sensitivity of ultrathin gate inputs in advanced sub-90nm…”
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