Search Results - "Appleyard, N.J."

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Modification of a shallow 2DEG by AFM lithography

    Modification of a shallow 2DEG by AFM lithography by Nemutudi, R., Curson, N.J., Appleyard, N.J., Ritchie, D.A., Jones, G.A.C.

    Published in Microelectronic engineering (01-09-2001)
    “…A conducting tip of an atomic force microscope (AFM) is used to induce ultra-small oxide patterns on metallic (Ti) thin film and semiconducting (GaAs)…”
    Get full text
    Journal Article Conference Proceeding
    Save to List
    Saved in:
  2. 2
    Thermopower of one-dimensional devices – measurement and applications

    Thermopower of one-dimensional devices – measurement and applications by Appleyard, N.J, Nicholls, J.T, Tribe, W.R, Simmons, M.Y, Pepper, M

    “…We have developed a technique to measure the thermopower of a mesoscopic device. Absolute calibration is possible, and we find that a constriction in a 2D…”
    Get full text
    Journal Article
    Save to List
    Saved in:
  3. 3
    The ripplon-limited mobility of ions trapped below the free surface of superfluid helium

    The ripplon-limited mobility of ions trapped below the free surface of superfluid helium by APPLEYARD, N. J, COX, G. F, SKRBEK, L, SOMMERFELD, P. K. H, VINEN, W. F

    Published in Journal of low temperature physics (01-12-1994)
    Get full text
    Journal Article
    Save to List
    Saved in:

Search Tools: