Search Results - "Anoop Gopinath"
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Low power-high speed performance of 8T static RAM cell within GaN TFET, FinFET, and GNRFET technologies – A review
Published in Solid-state electronics (01-01-2020)“…Recent ULSI technology development emphasizes both silicon and graphene-based devices and system performance in terms of their low power and high switching…”
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Journal Article -
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SRAM design leveraging material properties of exploratory transistors
Published in Materials today : proceedings (2022)“…While MOSFET miniaturization continues to face increased challenges related to process variations, supply voltage scaling and leakage currents, exploratory…”
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Journal Article -
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Low-power Hybrid TFET-CMOS Memory
Published 01-01-2018“…The power consumption and the switching speed of the current CMOS technology have reached their limits. In contrast, architecture design within computer…”
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Dissertation -
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Leakage Current and Static Power Analysis of TFET 8T-SRAM Cell
Published in Materials today : proceedings (2019)“…Static Random Access Memory (SRAM) is primarily used for design of upper-level memories such as registers and caches due to its speed and reliability. The…”
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Journal Article -
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Phenotypes of South Asian patients with atrial fibrillation and holistic integrated care management: cluster analysis of data from KERALA-AF Registry
Published in The Lancet regional health. Southeast Asia (01-12-2024)“…Patients with atrial fibrillation (AF) frequently experience multimorbidity. Cluster analysis, a machine learning method for classifying patients with similar…”
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Journal Article -
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Phenotypes of South Asian patients with atrial fibrillation and holistic integrated care management: cluster analysis of data from KERALA-AF RegistryResearch in context
Published in The Lancet regional health. Southeast Asia (01-12-2024)“…Background: Patients with atrial fibrillation (AF) frequently experience multimorbidity. Cluster analysis, a machine learning method for classifying patients…”
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Journal Article -
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SRAM Process and Debug Sensor
Published in NAECON 2023 - IEEE National Aerospace and Electronics Conference (28-08-2023)“…In this paper, a RAZOR-based in-situ monitoring scheme is described for process variation characterization and silicon debug in SRAM arrays. The scheme can…”
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Conference Proceeding -
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Evaluation of FinFET in Ultra Low Power ALU
Published in 2022 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) (06-06-2022)“…The data path and memory elements are integral hardware components to evaluate the performance of a complex ASIC low power architecture. In this study, a…”
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Conference Proceeding