Search Results - "Aniel, F"
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Tensile-strained germanium microdisk electroluminescence
Published in Optics express (09-03-2015)“…We report room temperature electroluminescence of tensile-strained germanium microdisks. The strain is transferred into the microdisks using silicon nitride…”
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2
Schottky electroluminescent diodes with n-doped germanium
Published in Applied physics letters (16-06-2014)“…n-doped germanium can be used as an active material for the realization of an optical source under electrical pumping. We propose to use Schottky contacts for…”
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3
Room-Temperature AlGaN/GaN Terahertz Plasmonic Detectors with a Zero-Bias Grating
Published in Journal of infrared, millimeter and terahertz waves (01-03-2016)“…In this paper, we present sensitivity measurement as well as measured and calculated absorption spectra for AlGaN/GaN THz plasmonic detector made of a metallic…”
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4
Full-Band Monte Carlo investigation of hole mobilities in SiGe, SiC and SiGeC alloys
Published in Thin solid films (26-02-2010)“…Hole transport properties in relaxed and biaxially strained Si 1- x Ge x , Si 1- y C y and Si 1- x- y Ge x C y alloys are investigated using a Full-Band Monte…”
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5
Optimal structure for resonant THz detection of plasmons-polaritons in the 2D quantum wells
Published in 2012 7th European Microwave Integrated Circuit Conference (01-12-2012)“…We investigate terahertz plasmon-polariton (PP) resonances for hetero-structures (AlGaN/GaN, SiGe/Si/SiGe, AlGaAs/GaAs and InAlN/GaN) with grating coupler in…”
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6
Coupling 3-D Maxwell's and Boltzmann's equations for analyzing a terahertz photoconductive switch
Published in IEEE transactions on microwave theory and techniques (01-09-2005)“…We present a terahertz photoconductive switch analysis. We explain the mechanism that allows the generation of the electromagnetic pulse and the phenomena that…”
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SiGe:C HBT transit time analysis based on hydrodynamic modeling using doping, composition and strained dependent SiGe:C carriers mobility and relaxation time
Published in Solid-state electronics (01-07-2011)“…► An original method to perform transit time analysis in SiGe HBT is described. ► It relies on analytical models of carrier mobilities and of energy relaxation…”
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8
230-GHz self-aligned SiGeC HBT for optical and millimeter-wave applications
Published in IEEE journal of solid-state circuits (01-10-2005)“…This paper describes a 230-GHz self-aligned SiGeC heterojunction bipolar transistor developed for a 90-nm BiCMOS technology. The technical choices such as the…”
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9
Electroluminescence of Ge/Si self-assembled quantum dots grown by chemical vapor deposition
Published in Applied physics letters (18-09-2000)“…We have fabricated light-emitting diodes on Si operating in the near-infrared. The active region of the p–i–n diodes consists of Ge/Si self-assembled quantum…”
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SiGe heterojunction bipolar transistor issues towards high cryogenic performances
Published in Cryogenics (Guildford) (01-11-2009)“…The performances increase at low temperature make the SiGe HBT a masterpiece for cryogenic circuits. The time-progressive enhancement of f T and f MAX toward…”
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11
Temperature dependence of the absorption saturation relaxation time in light- and heavy-ion-irradiated bulk GaAs
Published in Applied physics letters (24-06-2002)“…The absorption saturation relaxation time in light- and heavy-ion-irradiated GaAs saturable absorbers has been measured as a function of the temperature in the…”
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12
Modelling and measurements of the parasitic electrostatic capacitances in Si/SiGe n-HFET
Published in Solid-state electronics (01-03-2007)“…The influence of parasitic capacitance on high frequency performances of SiGe n-HFET is reported. These capacitances arising from the fringe and electrostatic…”
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13
Microwave noise performance and modeling of SiGe-based HFETs
Published in IEEE transactions on electron devices (01-11-2005)“…Microwave noise performance of SiGe-based heterostructure field effect transistors (HFETs) is presented. Noise parameters for devices with buried channel…”
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14
Strained silicon FETs on thin SiGe virtual substrates produced by He implantation: effect of reduced self-heating on DC and RF performance
Published in Solid-state electronics (01-10-2004)“…Strained-Si based SiGe MODFETs on ultra-thin SiGe virtual substrates prepared by molecular beam epitaxy (MBE) and helium implantation are presented and…”
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15
Double-Heterojunction Bipolar Transistor as THz Detector for Communications
Published in 2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) (29-08-2021)“…We investigate the use of an InP-based double-heterojunction bipolar transistor as a detector for wireless communications around 300~GHz. The sensitivity of…”
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Conference Proceeding -
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BenzoCycloButene-based in-Package Substrate Integrated Waveguides for sub-THz Applications
Published in 2020 50th European Microwave Conference (EuMC) (12-01-2021)“…This paper introduces an experimental characterization of substrate integrated waveguide (SIW) components integrated in a benzocyclobutene-based interposer for…”
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17
Microwave properties of silicon junction tunnel diodes grown by molecular beam epitaxy
Published in IEEE electron device letters (01-06-2002)“…The bias dependence of the single-port microwave reflection gain of 15 μm-diameter Si Esaki tunnel diodes, grown by molecular beam epitaxy, was studied as a…”
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18
Strained Si HFETs for microwave applications: state-of-the-art and further approaches
Published in Solid-state electronics (01-08-2004)“…This paper reviews the RF and noise performance of strained Si heterostructure field-effect transistors. For SiGe n-HFETs the high RF figures of merit f T=90…”
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Microwave performances of silicon heterostructure-FETs
Published in Applied surface science (15-03-2004)“…We present the state of the art of microwave performances of silicon heterostructures FETs (hetero-FETs). Recent advances are illustrated on using…”
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20
Electroluminescence spectroscopy for reliability investigations of 1.55 μm bulk semiconductor optical amplifier
Published in Microelectronics and reliability (01-09-2005)“…This paper demonstrates the complementary relation between functional parameters and electroluminescence spectroscopy for reliability investigations of 1550 nm…”
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