Search Results - "Alvis, Roger L"

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  1. 1
    Atom Probe Tomography of Electronic Materials

    Atom Probe Tomography of Electronic Materials by Kelly, Thomas F, Larson, David J, Thompson, Keith, Alvis, Roger L, Bunton, Joseph H, Olson, Jesse D, Gorman, Brian P

    Published in Annual review of materials research (01-01-2007)
    “…The state of application of atom probe tomography to electronic materials is assessed. The benefits and challenges of the technique are discussed with regard…”
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  2. 2
    Atom probe tomography today

    Atom probe tomography today by Cerezo, Alfred, Clifton, Peter H., Galtrey, Mark J., Humphreys, Colin J., Kelly, Thomas F., Larson, David J., Lozano-Perez, Sergio, Marquis, Emmanuelle A., Oliver, Rachel A., Sha, Gang, Thompson, Keith, Zandbergen, Mathijs, Alvis, Roger L.

    Published in Materials today (Kidlington, England) (01-12-2007)
    “…This review aims to describe and illustrate the advances in the application of atom probe tomography that have been made possible by recent developments,…”
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  3. 3
    Abbreviated tomography techniques for quick correction of slides in 3-Dimensional NAND Flash architectures

    Abbreviated tomography techniques for quick correction of slides in 3-Dimensional NAND Flash architectures by Lee, Hee-Beom, Ishimaru, Masahiro, McPhillips, John, Alvis, Roger L., Johnson, Timothy A., Kang, Christopher H., Choi, Inchang, Cho, Youngjin, Choi, Kiju

    “…A high stack structure is being developed to increase the 3D NAND Flash storage capacity. However, problems such as bowing, incomplete etching, and twisting…”
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  4. 4
    Three-dimensional atomic-scale mapping of Pd in Ni1−xPdxSi∕Si(100) thin films

    Three-dimensional atomic-scale mapping of Pd in Ni1−xPdxSi∕Si(100) thin films by Kim, Yeong-Cheol, Adusumilli, Praneet, Lauhon, Lincoln J., Seidman, David N., Jung, Soon-Yen, Lee, Hi-Deok, Alvis, Roger L., Ulfig, Rob M., Olson, Jesse D.

    Published in Applied physics letters (10-09-2007)
    “…Atom-probe tomography was utilized to map the three-dimensional distribution of Pd atoms in nickel monosilicide thin films on Si(100). A solid-solution…”
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  5. 5
    Three-dimensional atomic-scale mapping of Pd in Ni 1 − x Pd x Si ∕ Si ( 100 ) thin films

    Three-dimensional atomic-scale mapping of Pd in Ni 1 − x Pd x Si ∕ Si ( 100 ) thin films by Kim, Yeong-Cheol, Adusumilli, Praneet, Lauhon, Lincoln J., Seidman, David N., Jung, Soon-Yen, Lee, Hi-Deok, Alvis, Roger L., Ulfig, Rob M., Olson, Jesse D.

    Published in Applied physics letters (12-09-2007)
    “…Atom-probe tomography was utilized to map the three-dimensional distribution of Pd atoms in nickel monosilicide thin films on Si(100). A solid-solution Ni 0.95…”
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