Search Results - "Ali karar, N.N."

Spectroscopic ellipsometry characterization of Ge30-xSbx Se70 films using combinations of multiple dispersion functions by Abdel-Wahab, F., Badawi, A., Alatibi, M.S., Alomairy, S.E., Ali karar, N.N., Ashraf, I.M., Ahmed, E.M.

“…Variable angle spectroscopic ellipsometry (VASE) was employed to study the optical properties of Ge30-xSbx Se70 (x=0, 5, 10, 15 and 25) films in the UV–vis-NIR…”
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Time dependent bond arrangement approach to photo-induced changes in Ge30-Sb Se70 thin films by Abdel-Wahab, F., Ali Karar, N.N., Merazga, A.

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Time dependent bond arrangement approach to photo-induced changes in Ge30-xSbxSe70 thin films by Abdel-Wahab, F., Ali Karar, N.N., Merazga, A.

“…The transmission spectra of thermal evaporation amorphous Ge30-xSbxSe70 (x = 0, 5, 10, 15) thin films measured before and after different time of light…”
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Effect of Sb on the optical properties of the Ge–Se chalcogenide thin films by Abdel-Wahab, F., Ali karar, N.N., El Shaikh, H.A., Salem, R.M.

“…Thin films of Ge30−xSbxSe70 (x=0, 5, 10 and 15) were prepared by thermal evaporation technique. All samples were confirmed as amorphous according to XRD…”
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