Alpha-particle and neutron-induced single-event transient measurements in subthreshold circuits

Experimental data from alpha particle, neutron, and heavy ion testing are discussed and analyzed from a sub-threshold voltage SET characterization circuit. Using a Schmitt trigger inverter target chain fabricated in a 28-nm bulk CMOS process, SET pulse widths are captured from an operating voltage d...

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Bibliographic Details
Published in:	2016 IEEE International Reliability Physics Symposium (IRPS) pp. SE-1-1 - SE-1-6
Main Authors:	Gadlage, Matthew J., Roach, Austin H., Duncan, Adam R., Halstead, Matthew R., Kay, Matthew J., Gadfort, Peter, Alhbin, Jonathan R., Stansberry, Scott
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-04-2016
Subjects:	Alpha particles Atmospheric measurements Inverters Ions Neutrons Particle measurements radiation single-event transients soft errors subthreshold Voltage measurement
Online Access:	Get full text
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Summary:	Experimental data from alpha particle, neutron, and heavy ion testing are discussed and analyzed from a sub-threshold voltage SET characterization circuit. Using a Schmitt trigger inverter target chain fabricated in a 28-nm bulk CMOS process, SET pulse widths are captured from an operating voltage down to 0.32 V. These results show that energetic particles can induce SET pulse widths that range up to hundreds of nanoseconds when operating at voltages well below the nominal voltage. Additionally, the results show that sub-Vt circuits are significantly more susceptible, as compared to circuits operating at nominal voltages, to low-energy particles inducing SETs that have a high probability of being latched as errors in a combinatorial logic design.
ISSN:	1938-1891
DOI:	10.1109/IRPS.2016.7574637