Characteristics of X-ray attenuation in electrospun bismuth oxide/polylactic acid nanofibre mats

The characteristics of the X‐ray attenuation in electrospun nano(n)‐ and micro(m)‐Bi2O3/polylactic acid (PLA) nanofibre mats with different Bi2O3 loadings were compared as a function of energy using mammography (i.e. tube voltages of 22–49 kV) and X‐ray absorption spectroscopy (XAS) (7–20 keV). Resu...

Full description

Saved in:
Bibliographic Details
Published in:Journal of synchrotron radiation Vol. 20; no. 5; pp. 741 - 748
Main Authors: Noor Azman, Nurul Z., Siddiqui, Salim A., Haroosh, Hazim J., Albetran, Hani M. M., Johannessen, Bernt, Dong, Yu, Low, It M.
Format: Journal Article
Language:English
Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01-09-2013
John Wiley & Sons, Inc
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The characteristics of the X‐ray attenuation in electrospun nano(n)‐ and micro(m)‐Bi2O3/polylactic acid (PLA) nanofibre mats with different Bi2O3 loadings were compared as a function of energy using mammography (i.e. tube voltages of 22–49 kV) and X‐ray absorption spectroscopy (XAS) (7–20 keV). Results indicate that X‐ray attenuation by electrospun n‐Bi2O3/PLA nanofibre mats is distinctly higher than that of m‐Bi2O3/PLA nanofibre mats at all energies investigated. In addition, with increasing filler loading (n‐Bi2O3 or m‐Bi2O3), the porosity of the nanofibre mats decreased, thus increasing the X‐ray attenuation, except for the sample containing 38 wt% Bi2O3 (the highest loading in the present study). The latter showed higher porosity, with some beads formed, thus resulting in a sudden decrease in the X‐ray attenuation.
Bibliography:istex:9366C6E403B542C2F940ED32596CE409D22C4420
ark:/67375/WNG-BW4G66SS-S
ArticleID:JSYRV5002
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ObjectType-Article-2
ObjectType-Feature-1
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049513017871