Search Results - "Aladinskii, V K"
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Control of degradation processes in electronic devices and prediction of their reliability
Published in Measurement techniques (01-01-1998)“…A method is proposed for controlling degradation processes and the reliability of electronic devices with the aid of a system of informative parameters…”
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2
New generation of ultrastable precision stabilitrons
Published in Measurement techniques (01-11-1996)Get full text
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3
Precision silicon stabilitrons
Published in Measurement techniques (01-08-1964)Get full text
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